Statistical acquisition for embedded instrumentation

One of the main problems when developing analog filters in VLSI is to achieve high accuracy regarding the cutoff frequency. This is mainly due to the difficulty in obtaining accurate time constants. Testing of such filters is also challenging, in the sense that special equipment is required. Small deviations in the resistor or capacitor values may lead to a very high mismatch between the expected and the achieved cutoff frequency. Although switched-capacitor or active-transistor techniques may produce good results, the cost to use such approaches becomes another limiting factor, and only increases the tester needs. In this work, we present the development of an analog FIR filter, which does not use passive components to tune the cutoff frequency or the quality factor. Instead, the filter coefficients and the input signal are represented in a bit stream fashion, and are digitally processed, thus avoiding the use of expensive analog-todigital converters. The impact of this filter architecture on test cost and possible design-for-test techniques are discussed in this paper.

show abstract

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

hi@scite.ai

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

Statistical acquisition for embedded instrumentation

Cited by 2 publications

References 8 publications

Spare Parts in Analog Circuits: a Filter Example

Spare Parts in Analog Circuits: a Filter Example

A Digitally Testable Capacitance-Insensitive Mixed-Signal Filter

Contact Info

Product

Resources

About