Although one can find several pattern recognition techniques out there, there is still room for improvements and new approaches. In this book chapter, we revisited the Optimum-Path Forest (OPF) classifier, which has been evaluated over the last years in a number of applications that consider supervised, semi-supervised and unsupervised learning problems. We also presented a brief compilation of a number of previous works that employed OPF in different research fields, that range from remote sensing image classification to medical data analysis.