1983
DOI: 10.1111/j.1151-2916.1983.tb10004.x
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Static Fatigue of Preoxidized Hot‐Pressed Silicon Nitride

Abstract: Hot‐pressed Si3N4 samples were preoxidized and tested in stress rupture. The lifetime of preoxidized samples was compared to samples that were not pretreated; for the test conditions chosen, lifetime was shorter for the preoxidized samples.

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Cited by 8 publications
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