Static component interconnection test technology in practice

Abstract

Static Component Interconnection Test Technology (SCITT) is a new XNOR circuit based technology that is used for board-level interconnection test. SCITT provides an easy test method using simple patterns and results in a high diagnostic resolution. The method is especially suited for SDRAM and other 'complex memories' but can be used for other devices as well. Very little overhead is required. A real silicon implementation is presented and evaluated.