2018
DOI: 10.1016/j.newast.2017.09.006
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Stark widths regularities within spectral series of sodium isoelectronic sequence

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Cited by 7 publications
(3 citation statements)
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“…The scaling of line widths with electron temperature has been discussed in previous literature. Trklja [43] and Dimitrijević [44] proposed a simple formula of the form…”
Section: Computational Results and Discussionmentioning
confidence: 99%
“…The scaling of line widths with electron temperature has been discussed in previous literature. Trklja [43] and Dimitrijević [44] proposed a simple formula of the form…”
Section: Computational Results and Discussionmentioning
confidence: 99%
“…Dependences of Stark widths on the upper level ionization potential have been investigated for N I-N V [51,68], O I-O VI [53,68], Ne I-Ne VI [65,68], Ar III, Ar IV [65], Cl II, Cl III, Cl IV, F I-F IV [66,69], Kr I-Kr IV, Xe I, Xe II, Xe III [67], Si I-Si IV [68,69], and C IV [69] spectral lines, within different spectral series of neutral beryllium [60], lithium [62,64], and sodium [63,64] isoelectronic sequences. These data were used for the consideration of general regularities of Stark broadening parameters for ion lines [70], Stark parameter regularities of multiply charged ion spectral lines originating from the same transition array [73], and for checking the dependence on the upper level ionization potential of electron impact widths using quantum calculations [75].…”
Section: Regularities and Systematic Trendsmentioning
confidence: 99%
“…Influence of electron density and temperature on Stark broadening of spectral lines, within spectral series of potassium isoelectronic sequence, have been studied before Equation (1) has been applied in regularity analyzing procedure. Regularity approach used in present paper has been successfully applied previous articles of our group [8][9][10][11][12][13][14][15], where other emitters were analyzed.…”
Section: Theoretical Backgroundmentioning
confidence: 99%