2011
DOI: 10.1071/as11014
|View full text |Cite
|
Sign up to set email alerts
|

Stark Width Regularities within Beryllium Spectral Series

Abstract: Abstract:The dependences of Stark width on the upper-level ionization potential within different series of the neutral beryllium spectral lines have been studied. The dependences previously observed for electron impact contribution to the Stark widths were also obtained for the proton impact contribution. The emphasis is on the fine structure influence on the studied Stark parameter dependences. The influence of temperature on the dependences of Stark width parameters has been demonstrated. The relations found… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

1
5
0

Year Published

2011
2011
2020
2020

Publication Types

Select...
8

Relationship

0
8

Authors

Journals

citations
Cited by 9 publications
(6 citation statements)
references
References 30 publications
1
5
0
Order By: Relevance
“…Therefore, the aim of this paper is to study the dependences of electron, proton and ionized helium impact contributions to the Stark widths of helium neutral spectral lines originating from different spectral series on the upper‐level ionization potential. This is in continuation to already published papers devoted to regularities within the spectral series of Mg i (Tapalaga, Dojčinović & Purić 2011) and Be i (Dojčinović, Tapalaga & Purić 2011) spectral series. The emphasis will be on the term structure influence on the studied Stark parameter dependences.…”
Section: Introductionsupporting
confidence: 85%
See 1 more Smart Citation
“…Therefore, the aim of this paper is to study the dependences of electron, proton and ionized helium impact contributions to the Stark widths of helium neutral spectral lines originating from different spectral series on the upper‐level ionization potential. This is in continuation to already published papers devoted to regularities within the spectral series of Mg i (Tapalaga, Dojčinović & Purić 2011) and Be i (Dojčinović, Tapalaga & Purić 2011) spectral series. The emphasis will be on the term structure influence on the studied Stark parameter dependences.…”
Section: Introductionsupporting
confidence: 85%
“…Greater dissipation occurs only in the case of the 2p–4d (3) spectral line. It should be noted that, in contrast to a small number of existing experimental data for spectral series of Mg i (Tapalaga et al 2011) and Be i (Dojčinović et al 2011), there exist a high number of experimental data for He i spectral series. This provides us with an opportunity to use equations () and (2) to analyse the existing experimental data.…”
Section: Stark Width Regularitiesmentioning
confidence: 99%
“…Dependences of Stark widths on the upper level ionization potential have been investigated for N I-N V [51,68], O I-O VI [53,68], Ne I-Ne VI [65,68], Ar III, Ar IV [65], Cl II, Cl III, Cl IV, F I-F IV [66,69], Kr I-Kr IV, Xe I, Xe II, Xe III [67], Si I-Si IV [68,69], and C IV [69] spectral lines, within different spectral series of neutral beryllium [60], lithium [62,64], and sodium [63,64] isoelectronic sequences. These data were used for the consideration of general regularities of Stark broadening parameters for ion lines [70], Stark parameter regularities of multiply charged ion spectral lines originating from the same transition array [73], and for checking the dependence on the upper level ionization potential of electron impact widths using quantum calculations [75].…”
Section: Regularities and Systematic Trendsmentioning
confidence: 99%
“…Influence of electron density and temperature on Stark broadening of spectral lines, within spectral series of potassium isoelectronic sequence, have been studied before Equation (1) has been applied in regularity analyzing procedure. Regularity approach used in present paper has been successfully applied previous articles of our group [8][9][10][11][12][13][14][15], where other emitters were analyzed.…”
Section: Theoretical Backgroundmentioning
confidence: 99%