Abstract:Flip chip technology is the emerging interconnect technology for the next generation of high performance electronics. One of the important criteria for the reliability issue is the size of the gap between the die and the substrate i.e. standoff height. A nondestructive technique using the Scanning Acoustic Microscopy ( S A M ) for the standoff height measurement of flip chip assemblies is demonstrated. The method, by means of the implementation of the pulse separation technique, time difference of the represen… Show more
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