Abstract:The stability and reliability at high temperature of Ti3SiC2 based ohmic contacts on ptype 4H-SiC (0001) 4°-off substrates were studied. The contact was grown from Ti100-xAlx alloys annealed at high temperature (from 900°C to 1200°C). The Specific Contact Resistance (SCR) at room temperature and at high temperature (up to 600°C) was in the 10 -4 -10 -5 Ω.cm 2 range. A Schottky barrier height of 0.71 to 0.85 eV was calculated for the set of samples. After aging period at 600°C for 1500h, the SCR was very stable… Show more
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