Stability of nanosized alloy thin films: Faulting and phase separation in metastable Ni/Cu/Ag-W films

Csiszár, Gábor; Kurz, Silke; Mittemeijer, E. J.

doi:10.1016/j.actamat.2016.02.068

Cited by 28 publications

(21 citation statements)

References 63 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The intensity peak (marked #1) originates from {111} lattice planes inclined at about 70.57 with respect to the surface in accordance with the {111} fibre texture. With reference to previous analyses of Ni-W, Cu-W and Ag-W thin films (Welzel et al, 2011;Csiszá r et al, 2016), and by careful inspection of Fig. 2(a) [cf.…”

Section: Resultsmentioning

confidence: 97%

“…The 111, 220, 311 and 402 reflections were measured at tilt angles of 0, 88, 58.52 and 39.23 , respectively, in compliance with the {111} fibre texture. To obtain a value for the lattice parameter from the diffraction peak position, the diffraction peaks were fitted using the Voigt function (Csiszá r et al, 2016). In all cases, error calculation was performed using generalized Gaussian error propagation with first-order multivariable Taylor-expanded functions.…”

Section: X-ray Diffraction Measurements and Evaluationmentioning

confidence: 99%

“…(ii) GBs (phase boundaries) in nano-sized materials contain a high amount of excess free volume (Kuru et al, 2009), which is typically annihilated upon annealing for a Cu-based material in the temperature range concerned (Csiszá r et al, 2016).…”

Section: Stress Evolution During Heat Treatmentmentioning

confidence: 99%

“…On the basis of the measured values of the strain-free lattice parameter at different temperatures for the Cu(Mo) and the Ag(Mo) solid solutions in the films, the relative expansion with reference to the strain-free lattice parameter at the start of annealing was calculated according to equation (4) (Welzel et al, 2011;Csiszá r et al, 2016):…”

Section: Stress Evolution During Heat Treatmentmentioning

confidence: 99%

“…Recognizing the high volume fraction of grain boundaries in nanomaterials, the total Gibbs energy of nanocrystalline metals is relatively high (Csiszá r et al, 2016), so a pronounced driving force for nanograin coarsening can operate and, at a sufficiently high temperature, generally the nanoscale microstructure cannot be maintained (Gertsman & Birringer, 1994;Weissmü ller, 1993). In the case of a number of nanocrystalline pure face-centred cubic (f.c.c.)…”

Section: Introductionmentioning

confidence: 99%

See 4 more Smart Citations

Nanoscale stability of two- and three-dimensional defects in Cu/Ag–Mo thin films

2017

Self Cite

View full text Add to dashboard Cite

A comparative study of the thermal stability of nanocrystalline Cu-Mo and Ag-Mo alloy thin films was performed. Phase decomposition, texture evolution, grain coarsening and segregation of Mo to planar faults of both films, before and after heat treatment, were studied using X-ray diffraction measurements and (high-resolution) transmission electron microscopy with energy-dispersive spectroscopy. The evolution of stress/strain in the thin films was traced by in situ X-ray diffraction measurements. The segregation of Mo solute atoms at twin boundaries in both films already occurs at room temperature. By first segregation and then precipitation of Mo atoms at grain boundaries, the columnar grain microstructure is preserved upon heat treatment. In the case of Ag-Mo thin films, the twin boundaries are also more or less preserved at elevated temperature, but in the case of Cu-Mo thin films the annihilation of twin boundaries takes place concomitantly with the precipitation of Mo in columnar grain interiors. 154 G. Csiszár et al. Stability of defects in Cu/Ag-Mo thin films J. Appl. Cryst. (2017). 50, 152-171 Figure 1XRD patterns of the as-deposited (a) Cu(Mo)-9.1 and (b) Ag(Mo)-10.1 films at different angles of tilt, , ranging from 0 to 85 , with respect to the specimen-surface normal. The small peak appearing at 2 ' 37 is due to the K radiation contained in the incident wavelength spectrum. research papers J. Appl. Cryst. (2017). 50, 152-171 G. Csiszár et al. Stability of defects in Cu/Ag-Mo thin films 169

show abstract

Section: Resultsmentioning

confidence: 97%

Section: X-ray Diffraction Measurements and Evaluationmentioning

confidence: 99%