Abstract:Bimodal amplitude modulation atomic force microscopy (AM-AFM) is widely used in nanoscale topography and mechanical property imaging for a variety of materials. In this paper, the stability of the amplitude/phase spectroscopy curves and the imaging contrast in bimodal AM-AFM for different mode combinations are investigated computationally in ambient air. The results show that with the second mode amplitude used for topography feedback on a stiff material, the amplitude/phase spectroscopy would probably undergo… Show more
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