2022
DOI: 10.1063/5.0085325
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Stability and contrast in bimodal amplitude modulation atomic force microscopy for different mode combinations in ambient air

Abstract: Bimodal amplitude modulation atomic force microscopy (AM-AFM) is widely used in nanoscale topography and mechanical property imaging for a variety of materials. In this paper, the stability of the amplitude/phase spectroscopy curves and the imaging contrast in bimodal AM-AFM for different mode combinations are investigated computationally in ambient air. The results show that with the second mode amplitude used for topography feedback on a stiff material, the amplitude/phase spectroscopy would probably undergo… Show more

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