SRAMs SEL and SEU in-flight data from PROBA-II spacecraft

D'Alessio, M.; Poivey, C.; Ferlet-Cavrois, V.; Evans, H.; Harboe-Sørensen, R.; Keating, A.; Lopez-Calle, I.; Guerre, F. X.; Lochon, Frédéric; Santandrea, Stefano; Zadeh, Ali; Muschitiello, M.; Markgraf, Markus; Montenbruck, Oliver; Grillenberger, Andreas; Fleurinck, N.; Puimege, K.; Gerrits, D.; Matthijs, P.

doi:10.1109/radecs.2013.6937398

Cited by 23 publications

(14 citation statements)

References 4 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The proposed approach has been validated with a comparison between the calculation results and the in-flight data reported by M. D'Alessio et al [22]. Particularly, in this section, the PROBA-II mission in-flight SER data have been compared with our calculation results for the AT68166 MultiChip module built with four 0.25 μm AT60142F 4 Mbit devices.…”

Section: B Proba-ii Mission's In-flight Data Analysismentioning

confidence: 87%

“…The LET spectrum has been generated in the OMERE tool with the PROBA-II orbit parameters as in [22]: 700 km altitude, 98.28° inclination, 3 years duration since March 1, 2010, 10 mm aluminum shield and CRÈME96 solar maximum conditions. The results of the comparison in Table IV show that despite the fact that our method has no free fitting parameters, it gives the best agreement with the on-board data compared to the IRPP calculations.…”

Section: B Proba-ii Mission's In-flight Data Analysismentioning

confidence: 99%

“…The results of the comparison in Table IV show that despite the fact that our method has no free fitting parameters, it gives the best agreement with the on-board data compared to the IRPP calculations. [11,22]. Note that a decreasing dependence of SER upon the SV depth Z, typical for IRPP method, is a controversial artifact of traditional methods.…”

Section: B Proba-ii Mission's In-flight Data Analysismentioning

confidence: 99%

See 2 more Smart Citations

Compact Modeling and Simulation of Heavy Ion Induced Soft Error Rate in Space Environment: Principles and Validation

Зебрев

Galimov

2017

IEEE Trans. Nucl. Sci.

View full text Add to dashboard Cite

-A simple physical model for calculation of the ioninduced soft error rate in space environment has been proposed, based on the phenomenological cross section notion. Proposed numerical procedure is adapted to the multiple cell upset characterization in highly scaled memories. Nonlocality of the ion impact has been revealed as the key concept determining the difference between physical processes in low scaled and highly scaled memories. The model has been validated by comparison between the simulation results and the literature on-board data. It was shown that proposed method provides single-valued prediction results correlating well with on-board data based solely on cross section data and LET spectra without any hidden fitting parameters and procedures.

show abstract

Section: B Proba-ii Mission's In-flight Data Analysismentioning

confidence: 87%

Section: B Proba-ii Mission's In-flight Data Analysismentioning

confidence: 99%

Section: B Proba-ii Mission's In-flight Data Analysismentioning

confidence: 99%

See 1 more Smart Citation

Compact Modeling and Simulation of Heavy Ion Induced Soft Error Rate in Space Environment: Principles and Validation

Зебрев

Galimov

2017

IEEE Trans. Nucl. Sci.

View full text Add to dashboard Cite

show abstract

“…The SEL RPP depth of a deep submicron SRAM is estimated to be m using TPA laser testing [13]. In the recent latchup rate calculations, the SV thickness of deep submicron SRAMs is set to m [4], [6] or m [5], [7]- [9], [11]. In this paper, the main point is to investigate the influence of SV number on SEL rate and so the SV thickness is assumed to be the classical value of m.…”

Section: Sel Rate Predictionsmentioning

confidence: 99%

“…As for memory device, there are two empirical practices to deal with the SEL SV number: one assumes that there is only one SV in the whole device [4]- [6], another assumes that there are as much SEL SVs as the number of memory cells [7]- [9]. The number of SV, which has not been clearly stated in some SEL rate predictions [10]- [13], should be one of the two assumptions.…”

Section: Introductionmentioning

confidence: 99%

Correction of Single Event Latchup Rate Prediction Using Pulsed Laser Mapping Test

Han

Feng

et al. 2015

IEEE Trans. Nucl. Sci.

View full text Add to dashboard Cite

Most classical approaches of single event effect rate prediction are based on the rectangular parallelepiped model of sensitive volume. However it is not clear about the number of sensitive volume in the device when predicting the in-flight single event latchup rate. As for memory device, there are two empirical practices to deal with the latchup sensitive volume number: one assumes that there is only one sensitive volume in the whole device; another assumes that there are as much sensitive volumes as the number of memory cells. The latchup sensitive volume number of a 4M-bits SRAM is determined as 63360 using pulsed laser mapping test in this work first. Based on the two assumed and measured sensitive volume number, the single event latchup rates of the device are calculated and compared. The results show that pulsed laser could be a powerful tool to obtain the real sensitive volume number in the device, which is significant for single event latchup rate prediction. The latchup rate will be either overestimated or underestimated with the assumption of the sensitive volume number as one or as much as the number of memory cells.Index Terms-In-flight rate, pulsed laser, sensitivity mapping, single event latchup (SEL), SRAM.

show abstract

A review on radiation environment pathways to impacts: Radiation effects, relevant empirical environment models, and future needs

Jun,

Garrett,

Kim

et al. 2024

Advances in Space Research

View full text Add to dashboard Cite

SRAMs SEL and SEU in-flight data from PROBA-II spacecraft

Cited by 23 publications

References 4 publications

Compact Modeling and Simulation of Heavy Ion Induced Soft Error Rate in Space Environment: Principles and Validation

Compact Modeling and Simulation of Heavy Ion Induced Soft Error Rate in Space Environment: Principles and Validation

Correction of Single Event Latchup Rate Prediction Using Pulsed Laser Mapping Test

A review on radiation environment pathways to impacts: Radiation effects, relevant empirical environment models, and future needs

Contact Info

Product

Resources

About