2010
DOI: 10.1016/j.optmat.2009.12.002
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Sputtering configurations and the luminescence of rare earth-doped silicon rich oxide thin films

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Cited by 4 publications
(3 citation statements)
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“…During the preparation process of BiT‐based thin films, bismuth is very easy to volatilize to produce bismuth vacancies accompanying by oxygen vacancies. The defects usually act as traps to induce nonradiative transitions, and then results in emission degradation 22–24 . The high‐valent W 6+ substitution with proper concentration can decrease concentration of the oxygen vacancies in the host lattices, 25,26 and thus improve upconversion emissions.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…During the preparation process of BiT‐based thin films, bismuth is very easy to volatilize to produce bismuth vacancies accompanying by oxygen vacancies. The defects usually act as traps to induce nonradiative transitions, and then results in emission degradation 22–24 . The high‐valent W 6+ substitution with proper concentration can decrease concentration of the oxygen vacancies in the host lattices, 25,26 and thus improve upconversion emissions.…”
Section: Resultsmentioning
confidence: 99%
“…The defects usually act as traps to induce nonradiative transitions, and then results in emission degradation. [22][23][24] The high-valent W 61 substitution with proper concentration can decrease concentration of the oxygen vacancies in the host lattices, 25,26 [15][16][17] In BiT-based thin films, A-site substitution of larger Bi 31 ions by smaller rare-earth ions in the pseudo-perovskite layer can result in largely enhanced rotation…”
Section: Resultsmentioning
confidence: 99%
“…The defects usually act as traps to induce non-radiative transitions and hence result in emission degradation. [25][26][27] The high-valent W 6þ ions can effectively decrease oxygen vacancy concentration in the host crystal lattice, 16,28 and thus improve up-conversion emission intensity.…”
Section: Resultsmentioning
confidence: 99%