1989
DOI: 10.1103/physrevb.40.49
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Sputtering by fast ions based on a sum of impulses

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Cited by 179 publications
(62 citation statements)
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“…At large r ͑.35 Å͒, ions tend to have similar mean velocities, but away from the line of incidence of the MeV ion. A relatively steep transition region between 25 and 35 Å is also seen which is roughly consistent with the simple pressure pulse model for electronic sputtering [26]. In Fig.…”
supporting
confidence: 71%
See 1 more Smart Citation
“…At large r ͑.35 Å͒, ions tend to have similar mean velocities, but away from the line of incidence of the MeV ion. A relatively steep transition region between 25 and 35 Å is also seen which is roughly consistent with the simple pressure pulse model for electronic sputtering [26]. In Fig.…”
supporting
confidence: 71%
“…The local energy density triggers the fast "hot" chemistry responsible for bond rearrangement in the track [25]. However, the dependence of the mean velocity of the ions with the place of emission indicates ejection occurs in response to the volume force arising from the energy density gradient in the track [26]. It provides the momentum transfer critical for removing newly formed species from the surface sufficiently rapid for survival.…”
mentioning
confidence: 99%
“…In contrast, experimental measurements of heavy ion sputtering of ices, for which the very large yields are described by pressurized ejection (e.g., Johnson et al 1989b), exhibit an ejected molecule energy distribution of the form (Reimann et al 1984, O'Shaugnessy et al 1988). An energy spectrum which decays slowly at large E has also been suggested for micrometeorite impact (O'Keefe and Ahrens 1978).…”
Section: Modelmentioning
confidence: 93%
“…It is unclear at this point if cluster ion formation probabilities are charge dependent or not. In analogy to electronic resorption of intact bio-molecules, applicability of shock-wave [20] or pressurepulse [26] models would indicate that cluster ionization probabilities are largely independent of HCI charge and amount to -104 cluster-ions per amount of ablated material [27]. Measurements of total ablation rates are being performed.…”
Section: Secondary Ion Emissionmentioning
confidence: 99%