Spreading resistance and conductance anisotropy in multilayer MoS2
Gautham Vijayan,
Michael Uzhansky,
Elad Koren
Abstract:The increasing interest in realizing the full potential of two-dimensional (2D) layered materials for developing electronic components strongly relies on quantitative understanding of their anisotropic electronic properties. Herein, we use conductive atomic force microscopy to study the anisotropic electrical conductance of multilayer MoS2 by measuring the spreading resistance of circular structures of different radii ranging from 150 to 400 nm. The observed inverse scaling of the spreading resistance with con… Show more
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