2018
DOI: 10.1016/j.apsusc.2018.02.219
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SPR sensors for monitoring the degradation processes of Eu(dbm)3(phen) and Alq3 thin films under atmospheric and UVA exposure

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Cited by 16 publications
(19 citation statements)
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“…The reflectivity spectra are eventually sent to a data acquisition system connected to a personal computer (Figure 1a). When θ is greater than the attenuated total reflection angle (ATR) the SPP wave, here identified as TM 0 mode, can be excited in TM polarization [23,24], and if the thickness of the SiO 2 spacing layer is large enough, multiple resonances can be excited, both in TM and TE polarization [8,25].…”
Section: Methodsmentioning
confidence: 99%
“…The reflectivity spectra are eventually sent to a data acquisition system connected to a personal computer (Figure 1a). When θ is greater than the attenuated total reflection angle (ATR) the SPP wave, here identified as TM 0 mode, can be excited in TM polarization [23,24], and if the thickness of the SiO 2 spacing layer is large enough, multiple resonances can be excited, both in TM and TE polarization [8,25].…”
Section: Methodsmentioning
confidence: 99%
“…UV irradiation of organic thin films may induce changes in the refractive index (cf. [17] for a recent work). Polymers containing azo dyes were first studied by Todorov and coworkers [18], who showed, since the 1980s, that anisotropy could be monitored by irradiation with polarized light.…”
Section: Azobenzene Based Polymer Layer As a Reference Samplementioning
confidence: 99%
“…2D measurement of the refractive indices of a ∼ 2 µm thick polymer layer was performed [26], taking advantage of the prism coupled modes of resonance of a waveguide (cf. [17] for a related work). 3D determination of the refractive index was also reported for Azo containing polymers with modulated polarimetry [27], a set of three probe lasers [28], a combination of ellipsometry techniques [29] and waveguide spectroscopy [13].…”
Section: Thickness Estimation and Comparison With Afm Measurementsmentioning
confidence: 99%
“…We also want to explore the potentialities of SPR spectroscopy in the monitoring of the degradation processes of organic luminescent thin films, with the aim to develop organic material based SPR-UVA dosimeter in the Surface Plasmon Coupled Emission configuration [46].…”
Section: Objectivesmentioning
confidence: 99%
“…The nominal thickness of the organic thin films was 30 nm. The temperature was maintained at approximately 23 °C with a humidity of 50% [46]…”
mentioning
confidence: 99%