2014
DOI: 10.1103/physrevlett.112.236602
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Spontaneous Breaking of Time-Reversal Symmetry in Strongly Interacting Two-Dimensional Electron Layers in Silicon and Germanium

Abstract: We report experimental evidence of a remarkable spontaneous time reversal symmetry breaking in two dimensional electron systems formed by atomically confined doping of phosphorus (P) atoms inside bulk crystalline silicon (Si) and germanium (Ge). Weak localization corrections to the conductivity and the universal conductance fluctuations were both found to decrease rapidly with decreasing doping in the Si:P and Ge:P δ−layers, suggesting an effect driven by Coulomb interactions. In-plane magnetotransport measure… Show more

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Cited by 20 publications
(28 citation statements)
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References 42 publications
(74 reference statements)
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“…1 and Ref. 42) and n T (∝ T ) is the density of active two level fluctuators373842. The observation of magneto-fingerprinting in and the temperature dependence of establishes the dominance of UCF in our devices.…”
Section: Resultsmentioning
confidence: 57%
See 2 more Smart Citations
“…1 and Ref. 42) and n T (∝ T ) is the density of active two level fluctuators373842. The observation of magneto-fingerprinting in and the temperature dependence of establishes the dominance of UCF in our devices.…”
Section: Resultsmentioning
confidence: 57%
“…However for the Si:P -layer, we were not able to extract for lower density devices since the UCF noise was suppressed at due to a spontaneous breakdown of time reversal symmetry in the strongly interacting regime as has been explained in Ref. 42. The inset of Fig.…”
Section: Resultsmentioning
confidence: 90%
See 1 more Smart Citation
“…The thickness h of the conducting 2D systems in the single and bi-layer samples can be extracted by fitting Δ σ WL ( ϑ ) in Fig. 2a,c to a generalized angle-dependent Hikami-Larkin-Nagaoka expression 20 21 (see Supplementary Section 3 for more details) that includes an additional dephasing rate due to the parallel magnetic field 22 23 . We obtain thicknesses of h = 1.49 ± 0.03 and 6.17 ± 0.05 nm for the single and bi-layer sample, respectively, in agreement with thicknesses of 1.41 ± 0.05 and 7.3 ± 0.2 nm obtained by atom probe tomography.…”
Section: Resultsmentioning
confidence: 99%
“…However, in the context of low dimensional systems like P-donors arrays in Si, explicit inclusion of electron-electron correlations are known to affect the electronic behavior and may eventually dominate the transport behavior. 30 Nonetheless, the trends found here are expected to contribute to highly correlated chains, for which a detailed inclusion of the geometrical disorder and multi-valley effects may not be trivial.…”
Section: -31mentioning
confidence: 83%