2010
DOI: 10.1002/sia.3561
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Spin‐resolved photoemission microscopy and magnetic imaging in applied magnetic fields

Abstract: We describe a novel experimental facility at the BESSY II synchrotron, aiming at probing element-specific magnetic properties at the nm-length scale. It consists of a novel photoemission electron microscope with photoelectron spin analysis combined with a microfocus beamline and full X-ray polarization control. The facility is capable of magnetic imaging in applied fields allowing the observation of magnetic switching phenomena on a 30-nm-length scale.

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Cited by 65 publications
(48 citation statements)
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“…To obtain images with enough spatial resolution and magnetic sensitivity, the XPEEM technique has been used in the UE49-PGM-1-SPEEM beamline of the BESSY II synchrotron (HZB, Berlin). To obtain what we refer to as an x-rays magnetic circular dichroism (XMCD) image [31], circularly polarized x rays, whose energy is tuned to the Co L 3 absorption edge, incide at a low angle (16 • ) on the sample, while images are taken with the photoemission electron microscope both for x rays' left and right circular polarizations. As in regular XMCD, the difference of these two images normalized by their sum provides an image with magnetic contrast proportional to the projection of the magnetization along the direction of the incident beam wave vector, that is, the magnetic sensitivity direction (MSD).…”
Section: Methodsmentioning
confidence: 99%
“…To obtain images with enough spatial resolution and magnetic sensitivity, the XPEEM technique has been used in the UE49-PGM-1-SPEEM beamline of the BESSY II synchrotron (HZB, Berlin). To obtain what we refer to as an x-rays magnetic circular dichroism (XMCD) image [31], circularly polarized x rays, whose energy is tuned to the Co L 3 absorption edge, incide at a low angle (16 • ) on the sample, while images are taken with the photoemission electron microscope both for x rays' left and right circular polarizations. As in regular XMCD, the difference of these two images normalized by their sum provides an image with magnetic contrast proportional to the projection of the magnetization along the direction of the incident beam wave vector, that is, the magnetic sensitivity direction (MSD).…”
Section: Methodsmentioning
confidence: 99%
“…The CFN films were then patterned using focused ion beam lithography to define micrometer to sub-micrometer scale patterns. XMCD-PEEM measurements were performed at the SIM (X11MA) beamline at the Swiss Light Source [20] and at the UE49-PGMa beamline at the synchrotron radiation facility (BESSY) of the Helmholtz-Zentrum Berlin [21], both equipped with an Elmitec PEEM setup (type LEEM III). The energy of the circularly polarized x-rays was tuned to the Co L 3 edge (about 780 eV).…”
Section: Methodsmentioning
confidence: 99%
“…To image in-plane components the sample normal has to be tilted to an direction more perpendicular to the photon beam propagation, thus deteriorating the spatial resolution along the beam direction. Due to X-PEEM being an electron probing technique, it inherently faces severe challenges for applying magnetic fields in arbitrary directions and at higher field values, although certain efforts to compensate the impact of magnetic fields to the electron paths have been demonstrated [35].…”
Section: Methodsmentioning
confidence: 99%