2021
DOI: 10.3390/ma14195579
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Spin Polarization and Magnetic Moment in Silicon Carbide Grown by the Method of Coordinated Substitution of Atoms

Abstract: In the present work, a new method for obtaining silicon carbide of the cubic polytype 3C-SiC with silicon vacancies in a stable state is proposed theoretically and implemented experimentally. The idea of the method is that the silicon vacancies are first created by high-temperature annealing in a silicon substrate Si(111) doped with boron B, and only then is this silicon converted into 3C-SiC(111), due to a chemical reaction with carbon monoxide CO. A part of the silicon vacancies that have bypassed “chemical … Show more

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Cited by 9 publications
(17 citation statements)
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References 28 publications
(46 reference statements)
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“…As not only V Si but also other defects are formed in this case, the quality of SiC with V Si is not very high upon irradiation. Recently, in the work [9], a much simpler and more reliable method for obtaining silicon vacancies in SiC was proposed and implemented, based on the fact that the formation energy of V Si in silicon Si is much lower (∼3.3 eV) than in SiC. Initially, vacancies are created in Si thermally (i.e., by heating in vacuum to a temperature of T∼1340 ÷ 1380 • C).…”
Section: Introductionmentioning
confidence: 99%
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“…As not only V Si but also other defects are formed in this case, the quality of SiC with V Si is not very high upon irradiation. Recently, in the work [9], a much simpler and more reliable method for obtaining silicon vacancies in SiC was proposed and implemented, based on the fact that the formation energy of V Si in silicon Si is much lower (∼3.3 eV) than in SiC. Initially, vacancies are created in Si thermally (i.e., by heating in vacuum to a temperature of T∼1340 ÷ 1380 • C).…”
Section: Introductionmentioning
confidence: 99%
“…The overall diamond-like bond structure does not change in this case, which makes it possible to obtain high-quality layers of cubic 3C-SiC containing V Si by this method. The concentration of V Si in SiC is determined by the time of preliminary annealing of Si in vacuum [9,12,13]. The longer the annealing, the greater the amount of V Si .…”
Section: Introductionmentioning
confidence: 99%
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