Measurements of the magnetic properties of the magnetic semiconductor
Zn1−xMnxIn2Se4 for two Mn
compositions (x = 0.87
and 1.00) are presented in this work. The localized Mn ions in the layered rhombohedral structure
undergo a spin-freezing transition below 3.5 K. The frequency-dependent freezing temperature
Tf varies
as ΔTf/(TfΔlogω)≈0.022, indicating a spin-glass behaviour. From the frequency dependence of
Tf, the validity of the critical slowing down associated with a true phase transition is tested. For
T>Tc, the
dynamic scaling of the imaginary component of ac susceptibility data yields the following set of critical
parameters: zν = 9.7 ± 1.0, β = 1.18 ± 0.20 and
Tc = 2.61 ± 0.06 K
for x = 0.87
and zν = 10.7 ± 0.9, β = 1.20 ± 0.20 and
Tc = 3.43 ± 0.01 K
for x = 1.00. These values are in good agreement with reported values for other spin glasses.