2015
DOI: 10.1063/1.4923290
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Spin dynamics and frequency dependence of magnetic damping study in soft ferromagnetic FeTaC film with a stripe domain structure

Abstract: Perpendicular magnetic anisotropy (PMA) and low magnetic damping are the key factors for the free layer magnetization switching by spin transfer torque technique in magnetic tunnel junction devices. The magnetization precessional dynamics in soft ferromagnetic FeTaC thin film with a stripe domain structure was explored in broad band frequency range by employing micro-strip ferromagnetic resonance technique. The polar angular variation of resonance field and linewidth at different frequencies have been analyzed… Show more

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Cited by 11 publications
(12 citation statements)
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“…3 which is a signature of the formation of the stripe domain structure. According to the reported literatures, the film thickness possessing the stripe domain is about several hundred nanometers and the stripe domain comes from the weak perpendicular magnetic anisotropy that resulted from a stain and microstructure effect [8, 13, 1922]. Its critical thickness can be described by …”
Section: Resultsmentioning
confidence: 99%
“…3 which is a signature of the formation of the stripe domain structure. According to the reported literatures, the film thickness possessing the stripe domain is about several hundred nanometers and the stripe domain comes from the weak perpendicular magnetic anisotropy that resulted from a stain and microstructure effect [8, 13, 1922]. Its critical thickness can be described by …”
Section: Resultsmentioning
confidence: 99%
“…Thin film lattice constant (a ⊥ ) differs due to lattice mismatch between substrate and film (shown by vertical up arrows). This lattice mismatch causes rhombohedral distortion in the films and hence contributes to diagonally stretched unit cells along the [111] growth direction. The strain induced rhombohedral distortion in these epitaxial BiYIG films can be quantified using the parameter σ = (a b − a ⊥ )/a b = ∆a/a b , where, a b is the bulk BiYIG lattice parameter and a ⊥ is the stretched film lattice parameter along the [111] direction [2][3] [64].…”
mentioning
confidence: 99%
“…This lattice mismatch causes rhombohedral distortion in the films and hence contributes to diagonally stretched unit cells along the [111] growth direction. The strain induced rhombohedral distortion in these epitaxial BiYIG films can be quantified using the parameter σ = (a b − a ⊥ )/a b = ∆a/a b , where, a b is the bulk BiYIG lattice parameter and a ⊥ is the stretched film lattice parameter along the [111] direction [2][3] [64]. For set-A samples, XRD patterns show strain relaxation as the thickness increases from 10.2 to 200 nm (2θ value approaches the bulk value), the strain-induced lattice distortion decreases from | 1.162% | to almost ∼| 0.0% |.…”
mentioning
confidence: 99%
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