2015
DOI: 10.1103/physrevb.92.201203
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Spin-dependent direct gap emission in tensile-strained Ge films on Si substrates

Abstract: The circular polarization of direct gap emission of Ge is studied in optically excited tensile-strained Ge-on-Si heterostructures as a function of doping and temperature. Owing to the spin-dependent optical selection rules, the radiative recombinations involving strain-split light (cΓ-LH) and heavy hole (cΓ-HH) bands are unambiguously resolved. The fundamental cΓ-LH transition is found to have a low temperature circular polarization degree of about 85%, despite an off-resonance excitation of more than 300 meV.… Show more

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Cited by 11 publications
(16 citation statements)
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“…In this work, a set of samples characterized by different doping, but the same tensile strain, was addressed, demonstrating a record-high PL polarization degree of 85% at low temperatures for a not-intentionally doped sample. First-neighbor tight-binding (TB) calculations including strain-induced effects clarified that the DSP for CB electrons optically coupled to SO states is 90%, in striking agreement with the experimentally-reported PL data [152]. This further corroborated the physical picture according to which, in the low doping regime, the direct gap recombination is dominated by the small fraction of electrons optically coupled to the SO states, whereas electrons excited from HH and LH VB states possess a large kinetic energy and are more likely to be scattered out of the zone center.…”
Section: Optical Investigations Of the Spin Physics Of Group IV Matersupporting
confidence: 76%
See 1 more Smart Citation
“…In this work, a set of samples characterized by different doping, but the same tensile strain, was addressed, demonstrating a record-high PL polarization degree of 85% at low temperatures for a not-intentionally doped sample. First-neighbor tight-binding (TB) calculations including strain-induced effects clarified that the DSP for CB electrons optically coupled to SO states is 90%, in striking agreement with the experimentally-reported PL data [152]. This further corroborated the physical picture according to which, in the low doping regime, the direct gap recombination is dominated by the small fraction of electrons optically coupled to the SO states, whereas electrons excited from HH and LH VB states possess a large kinetic energy and are more likely to be scattered out of the zone center.…”
Section: Optical Investigations Of the Spin Physics Of Group IV Matersupporting
confidence: 76%
“…The impact of biaxial tensile strain on the spin-dependent direct-gap radiative recombination was studied by Vitiello et al utilizing epitaxial Ge-on-Si(001) heterostructures [152]. In this work, a set of samples characterized by different doping, but the same tensile strain, was addressed, demonstrating a record-high PL polarization degree of 85% at low temperatures for a not-intentionally doped sample.…”
Section: Optical Investigations Of the Spin Physics Of Group IV Matermentioning
confidence: 95%
“…Simultaneously, a few percent of the whole electron ensemble can be promoted at the edge of the Γ valley as |1/2, 1/2〉 spin-up electrons via transitions involving split-off |1/2, −1/2〉 VB states (Fig. 1a,b ) 6 , 40 , 41 .…”
Section: Resultsmentioning
confidence: 99%
“…To understand the presence of the two distinct contributions in the unpatterned Ge we take into account the tensile strain resulting from the thermal mismatch with the Si substrate. [23] This has a strong effect on the band structure of Ge since it induces a redshift and, most importantly, it breaks the valence band degeneracy at the center of the Brillouin zone, [22] as shown in the calculated band structure reported in Figure 3b. The two PL structures observed in the top panel of Figure 3a can thus be ascribed to radiative pathways at the center Γ of the Brillouin zone from the bottom of the conduction band (cΓ) towards heavy hole (HH) and light hole (LH) bands, respectively.…”
Section: B Experimental Proofmentioning
confidence: 91%
“…[20,21] To verify the presence of the PBG we performed continuous wave PL experiments on the microcrystals, comparing the results with those obtained on the reference unpatterned layer. [22] The comparison is useful to discriminate the effect of the material from that of the microstructure. To ensure that the microcrystals and the reference Ge film have the same material properties, we measured the PL of the epilayer in an unpatterned region of the same chip on which the fabrication process was performed.…”
Section: B Experimental Proofmentioning
confidence: 99%