2015
DOI: 10.1016/j.cap.2015.02.008
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Spetroscopic ellipsometry study on electrical and elemental properties of Sb-doped ZnO thin films

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Cited by 25 publications
(13 citation statements)
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“…For the analysis and interpretation of ZnO and AZO thin films and optical properties, a multilayer model was used, in which the substrate was silicon (from the program library), and the investigated layer was fit using the general oscillator (GO) model. To obtain the dispersion relationships of optical constants n and k in oxides, the most popular model is the Cauchy model (the simplest model for nonabsorbing layers) [41]; oxide layers are also modeled using the Tanguy model [42], the Drude model [43] and the oscillator model [44,45]. Two Tauc-Lorentz oscillators were used [46].…”
Section: ⎯⎯ 2 + 2 +mentioning
confidence: 99%
“…For the analysis and interpretation of ZnO and AZO thin films and optical properties, a multilayer model was used, in which the substrate was silicon (from the program library), and the investigated layer was fit using the general oscillator (GO) model. To obtain the dispersion relationships of optical constants n and k in oxides, the most popular model is the Cauchy model (the simplest model for nonabsorbing layers) [41]; oxide layers are also modeled using the Tanguy model [42], the Drude model [43] and the oscillator model [44,45]. Two Tauc-Lorentz oscillators were used [46].…”
Section: ⎯⎯ 2 + 2 +mentioning
confidence: 99%
“…Investigated dyes have broad absorption spectra, overlapping with the spectrum of sunlight, which makes it suitable for use as a donor element. Dyes were previously simulated using the Cauchy model [ 39 ] and EMA-layer [ 40 ], however, for the compounds under consideration, the oscillator model [ 41 , 42 ] was chosen because of the broad absorption band.…”
Section: Discussionmentioning
confidence: 99%
“…For further device optimization, such as designs for waveguide using InAlAs cladding layers [6], the complex refractive indexñ ¼ n þ ik and dielectric function ε ¼ñ 2 ¼ ε 1 þ iε 2 are needed. A few studies of the dielectric functions of In x Al 1Àx As alloys have been reported using spectroscopic ellipsometry (SE) [7,8], which is an excellent technique for determining ε data directly [9,10]. However, no analytic representations of these ε spectra as a continuous function of In-composition x have been reported to date.…”
Section: Introductionmentioning
confidence: 98%