Spectroscopy of the shear force interaction in scanning near-field optical microscopy

Hoppe, S.; Ctistis, Georgios; Paggel, J. J.; Fumagalli, P.

doi:10.1016/j.ultramic.2004.10.002

Cited by 8 publications

(4 citation statements)

References 23 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The blue layer indicates a thin water film as may be present on the sample under ambient conditions. understood [19], with a variety of mechanisms being discussed [103][104][105][106]. It has been suggested [107,108] that the tip experiences viscous damping from a thin water layer adsorbed on the surface of the sample under ambient conditions [108][109][110].…”

Section: Methodsmentioning

confidence: 99%

“…The control mechanism in shear-force AFM is based on the near surface vibrational damping of a probe tip oscillating parallel to the surface. The nature of the shear-force damping mechanism is not yet fully understood [19], with a variety of mechanisms being discussed [103,104,105,106]. It has been suggested [107,108] that the tip experiences viscous damping from from a thin water layer adsorbed on the surface of the sample under ambient conditions [108,109,110].…”

Section: Methodsmentioning

confidence: 99%

See 1 more Smart Citation

Tip-Enhanced Raman Imaging and Nanospectroscopy: Sensitivity, Symmetry, and Selection Rules

2007

View full text Add to dashboard Cite

The fundamental mechanisms of tipenhanced Raman spectroscopy (TERS) have been investigated, including the role of the plasmonic excitation of the metallic tips, the nature of the optical tip-sample coupling, and the resulting local-field enhancement and confinement responsible for ultrahigh resolution imaging down to just several nanometers. Criteria for the distinction of near-field signature from far-field imaging artifacts are addressed. TERS results of molecules are presented. With enhancement factors as high as 10 9 , single-molecule spectroscopy is demonstrated. Spatially resolved vibrational mapping of crystalline nanostructures and determination of crystallographic orientation and domains is discussed making use of the symmetry properties of the tip scattering response and the intrinsic Raman selection rules.

show abstract

Section: Methodsmentioning

confidence: 99%

Section: Methodsmentioning

confidence: 99%

Tip-Enhanced Raman Imaging and Nanospectroscopy: Sensitivity, Symmetry, and Selection Rules

2007

View full text Add to dashboard Cite

show abstract

“…As an origin of the tip-sample interaction, different physical mechanisms were proposed: Van der Vaals forces, capillary forces [3], viscosity and elastic forces [4,5], electrostatic forces [6], "knocking" [7,8], "kinking" [9], torsion [10] or friction [11]. Despite published theories and experiments, no final answer about the nature of those interactions was found yet and new ideas are presented, like surface-depend elasticdissipative mechanism [12]. It must also be emphasized that in some papers one cannot find full information about the measurement conditions, thereby any referring to them can be difficult or impossible.…”

Section: Principle Of Tip-sample Interactionmentioning

confidence: 99%

The issues of near field interaction detection in developed combined shear force/ emission microscope

Sikora

Gotszalk

2009

J. Phys.: Conf. Ser.

View full text Add to dashboard Cite

Abstract. The shear force microscopy is one of few AFM methods which allow to scan the surface in the non-contact regime. The advantage of this technique is the possibility of investigation soft and fragile samples. The detection of near field interactions is performed by measurement of the oscillation amplitude of the scanning tip, which oscillates laterally to the surface. Although the method is used effectively in various applications (i.e. SNOM), the origin of the phenomena is still discussed and investigated. In this article we describe some particular experiments performed in order to develop the home built shear force microscope which was combined with emission measurement module. We also present the solution, which allows to prevent unwanted behaviour of the PID regulator, when the electrical field is applied to the tip.

show abstract

“…The mechanical resonance is intrinsically stable and the crystal's piezo-electric effect allows for direct electronic interfacing. Quartz tuning forks have proven to be extremely useful as sensors for temperature 1,2 , mass 3 , pressure [4][5][6][7] , and friction [8][9][10][11][12][13][14][15][16][17] . Due to their high mechanical quality factor Q between 10 3 to 10 5 they are very sensitive to environmental changes.…”

Section: Introductionmentioning

confidence: 99%

Controlling the quality factor of a tuning-fork resonance between 9 and 300 K for scanning-probe microscopy

Ctistis¹,

Frater²,

Huisman³

et al. 2011

J. Phys. D: Appl. Phys.

View full text Add to dashboard Cite

Abstract.We study the dynamic response of a mechanical quartz tuning fork in the temperature range from 9 K to 300 K. Since the quality factor Q of the resonance strongly depends on temperature, we implement a procedure to control the quality factor of the resonance. We show that we are able to dynamically change the quality factor and keep it constant over the whole temperature range. This procedure is suitable for applications in scanning probe microscopy.

show abstract

Spectroscopy of the shear force interaction in scanning near-field optical microscopy

Cited by 8 publications

References 23 publications

Tip-Enhanced Raman Imaging and Nanospectroscopy: Sensitivity, Symmetry, and Selection Rules

Tip-Enhanced Raman Imaging and Nanospectroscopy: Sensitivity, Symmetry, and Selection Rules

The issues of near field interaction detection in developed combined shear force/ emission microscope

Controlling the quality factor of a tuning-fork resonance between 9 and 300 K for scanning-probe microscopy

Contact Info

Product

Resources

About