In Situ Characterization of Thin Film Growth 2011
DOI: 10.1533/9780857094957.3.180
|View full text |Cite
|
Sign up to set email alerts
|

Spectroscopies combined with reflection high-energy electron diffraction (RHEED) for real-time in situ surface monitoring of thin film growth

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2019
2019
2019
2019

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
references
References 28 publications
0
0
0
Order By: Relevance