2024
DOI: 10.1016/j.optmat.2024.116200
|View full text |Cite
|
Sign up to set email alerts
|

Spectroscopic ellipsometry investigation of a 6H–SiC single crystal plate for potential use in graphene optoelectronic devices

Gharam A. Alharshan,
M.A.M. Uosif,
Omer A. Magzoub
et al.
Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 39 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?