2022
DOI: 10.1149/1945-7111/ac5ceb
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Spectroscopic Ellipsometry for Operando Monitoring of (De)Lithiation-Induced Phenomena on LiMn2O4 and LiNi0.5Mn1.5O4 Electrodes

Abstract: High voltage cathodes suffer from degradation phenomena that are challenging to observe and identify during cell operation. Dense and smooth sputtered thin films electrodes with an absence of binders and conductive additives allow a direct study of the active material upon Li insertion and extraction at surface and bulk. Using an operando spectroscopic ellipsometry set-up combined with a customized electrochemical-optical cell (EC-SE), the evolution of the optical absorption and thickness of LiMn2O4 and LiNi0.… Show more

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Cited by 4 publications
(10 citation statements)
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“…For an accurate thickness distribution, SE mapping is done on a 2 cm diameter area on the LNMO sample after annealing as shown in Figure 1b and fitted using previously developed optical models. 58 The thickness value of 78.42 ± 1.39 nm aligns with the cross-sectional imaging in Figure 1a. XRD pattern in Figure 1c exhibits the expected diffraction peaks of the pure disordered LNMO phase (spinel Fd3̅ m space group) and the peaks corresponding to the platinum current collector.…”
Section: ■ Introductionsupporting
confidence: 81%
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“…For an accurate thickness distribution, SE mapping is done on a 2 cm diameter area on the LNMO sample after annealing as shown in Figure 1b and fitted using previously developed optical models. 58 The thickness value of 78.42 ± 1.39 nm aligns with the cross-sectional imaging in Figure 1a. XRD pattern in Figure 1c exhibits the expected diffraction peaks of the pure disordered LNMO phase (spinel Fd3̅ m space group) and the peaks corresponding to the platinum current collector.…”
Section: ■ Introductionsupporting
confidence: 81%
“…Separate and relatively well-adhered layers are observed in the cross-section inspection. For an accurate thickness distribution, SE mapping is done on a 2 cm diameter area on the LNMO sample after annealing as shown in Figure b and fitted using previously developed optical models . The thickness value of 78.42 ± 1.39 nm aligns with the cross-sectional imaging in Figure a.…”
Section: Resultsmentioning
confidence: 67%
See 3 more Smart Citations