2007
DOI: 10.1039/b705288j
|View full text |Cite
|
Sign up to set email alerts
|

Spectroscopic diagnostics for evaluation of the analytical potential of argon + helium microwave-induced plasma with solution nebulization

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

1
14
0

Year Published

2008
2008
2023
2023

Publication Types

Select...
8

Relationship

1
7

Authors

Journals

citations
Cited by 26 publications
(17 citation statements)
references
References 37 publications
1
14
0
Order By: Relevance
“…Our previous work indicated [16] that for plasma loaded by a low solvent amount (more dried plasma), the electron number density was reduced. Similar effects were observed for Ar, He, and Ar + He microwave plasma-the electron number density was evidently higher for wet plasma (solution nebulization) [45]. It may be concluded that the increase in is mainly related to a much better thermal conductivity of the dry plasma with hydrogen than the plasma loaded with water.…”
Section: Electron Densitysupporting
confidence: 65%
“…Our previous work indicated [16] that for plasma loaded by a low solvent amount (more dried plasma), the electron number density was reduced. Similar effects were observed for Ar, He, and Ar + He microwave plasma-the electron number density was evidently higher for wet plasma (solution nebulization) [45]. It may be concluded that the increase in is mainly related to a much better thermal conductivity of the dry plasma with hydrogen than the plasma loaded with water.…”
Section: Electron Densitysupporting
confidence: 65%
“…In our earlier communication, 12 we reported the generation of a filament-type helium MIP at atmospheric pressure by using a TE 101 integrated microwave resonator. We observed that the robustness of helium MIP was lower than argon MIP, namely, Fig.…”
Section: Tolerance For Water Loadingmentioning
confidence: 99%
“…The amplitudes A n are still unknown, but applying equation (8) to be the least squares fitted to the measured data I(y) at each measurement position y k , one obtains:…”
Section: T Exc (A)mentioning
confidence: 99%
“…As a consequence, the diagnostics based on the thermal emission of solid or liquid particles, for example by the DPV-2000, are not applicable. Optical emission spectroscopy (OES) however can be used to determine the properties of the plasma jet [4][5][6][7][8] and was also introduced to characterize the injected material in thermal spray processes such as the VPS/LPPS [9].…”
Section: Introductionmentioning
confidence: 99%