Abstract:In this work recently produced and commercially available glazed ceramic object with metallic lustre decoration was studied by using a spectroscopic ellipsometer with rotating compensator.The thickness and metal content of the surface lustre layers are determined by ion beam analytical techniques, i.e., Rutherford backscattering spectrometry and external beam particleinduced X-ray emission and the results were utilized in the construction of multilayer optical models for the evaluation and interpretation of th… Show more
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