Abstract:Radiative thermal engineering with subwavelength metallic bodies is a key element for heat and energy management applications, communication and sensing.
“…A variety of wave phenomena emerges from the different physics of ENZ media, examples including supercoupling [5,6] and ideal fluid flow [7,8], geometry-invariant resonators [9], directive emission [10,11], photonic doping [12], nonradiating modes [13][14][15] and guided modes with a flat dispersion profile [16][17][18], just to name a few. Moreover, ENZ media intrinsically enhances light-matter interactions, as it is the case for nonlinear optics [19][20][21][22][23], electrical [24,25] and optical [26,27] modulation, spontaneous emission [28][29][30][31], magnon-optical photon coupling [32,33], entanglement generation [34,35], and light concentration on ultra-thin metallic films for thermal emitters [36,37] and optoelectronic [38] devices.…”
Section: Introductionmentioning
confidence: 99%
“…SiC is also an excellent material platform for investigating the impact of surface roughness on ENZ media for two reasons: First, it has a high-quality ENZ response, which has enabled the experimental demonstration of frequency pinning of resonant nanoantennas [53], ENZ high-impedance thermal emitters [36,37], and ENZ waveguide and cavity modes [54,55]. Second, its permittivity has a Lorentzian dispersion profile, including a band of negative permittivity supporting the propagation of surface phonon polaritons (SPhP), as well as frequency bands with a dielectric response.…”
Epsilon-near-zero (ENZ) media have been very actively investigated due to their unconventional wave phenomena and strengthened nonlinear response. However, the technological impact of ENZ media will be determined by the quality of realistic ENZ materials, including material loss and surface roughness. Here, we provide a comprehensive experimental study of the impact of surface roughness on ENZ substrates. Using silicon carbide (SiC) substrates with artificially induced roughness, we analyze samples whose roughness ranges from a few to hundreds of nanometer size-scales. It is concluded that ENZ substrates with roughness in the few nanometer scale are negatively affected by coupling to longitudinal phonons and strong ENZ fields normal to the surface. On the other hand, when the roughness is in the hundreds of nanometer scale, the ENZ band is found to be more robust than dielectric and surface phonon polariton (SPhP) bands.
“…A variety of wave phenomena emerges from the different physics of ENZ media, examples including supercoupling [5,6] and ideal fluid flow [7,8], geometry-invariant resonators [9], directive emission [10,11], photonic doping [12], nonradiating modes [13][14][15] and guided modes with a flat dispersion profile [16][17][18], just to name a few. Moreover, ENZ media intrinsically enhances light-matter interactions, as it is the case for nonlinear optics [19][20][21][22][23], electrical [24,25] and optical [26,27] modulation, spontaneous emission [28][29][30][31], magnon-optical photon coupling [32,33], entanglement generation [34,35], and light concentration on ultra-thin metallic films for thermal emitters [36,37] and optoelectronic [38] devices.…”
Section: Introductionmentioning
confidence: 99%
“…SiC is also an excellent material platform for investigating the impact of surface roughness on ENZ media for two reasons: First, it has a high-quality ENZ response, which has enabled the experimental demonstration of frequency pinning of resonant nanoantennas [53], ENZ high-impedance thermal emitters [36,37], and ENZ waveguide and cavity modes [54,55]. Second, its permittivity has a Lorentzian dispersion profile, including a band of negative permittivity supporting the propagation of surface phonon polaritons (SPhP), as well as frequency bands with a dielectric response.…”
Epsilon-near-zero (ENZ) media have been very actively investigated due to their unconventional wave phenomena and strengthened nonlinear response. However, the technological impact of ENZ media will be determined by the quality of realistic ENZ materials, including material loss and surface roughness. Here, we provide a comprehensive experimental study of the impact of surface roughness on ENZ substrates. Using silicon carbide (SiC) substrates with artificially induced roughness, we analyze samples whose roughness ranges from a few to hundreds of nanometer size-scales. It is concluded that ENZ substrates with roughness in the few nanometer scale are negatively affected by coupling to longitudinal phonons and strong ENZ fields normal to the surface. On the other hand, when the roughness is in the hundreds of nanometer scale, the ENZ band is found to be more robust than dielectric and surface phonon polariton (SPhP) bands.
“…52 The excellent optical properties of SiC have facilitated experimental demonstrations of superlensing, 53 extraordinary transmission, 54 thermal emitters driven by waste heat, 55 and parametric amplification of phonons. 56 SiC is also an excellent material platform for investigating the impact of surface roughness on ENZ media for two reasons: First, it has a high-quality ENZ response, which has enabled the experimental demonstration of frequency pinning of resonant nanoantennas, 57 ENZ high-impedance thermal emitters, 36,37 and ENZ waveguide and cavity modes. 58,59 Second, its permittivity has a Lorentzian dispersion profile, including a band of negative permittivity supporting the propagation of surface phonon polaritons (SPhP), as well as frequency bands with a dielectric response.…”
Section: Introductionmentioning
confidence: 99%
“…SiC is also an excellent material platform for investigating the impact of surface roughness on ENZ media for two reasons: First, it has a high-quality ENZ response, which has enabled the experimental demonstration of frequency pinning of resonant nanoantennas, ENZ high-impedance thermal emitters, , and ENZ waveguide and cavity modes. , Second, its permittivity has a Lorentzian dispersion profile, including a band of negative permittivity supporting the propagation of surface phonon polaritons (SPhP), as well as frequency bands with a dielectric response. As schematically depicted in Figure , a variety of polaritonic phenomena is excited at a rough SiC substrate, including distinct ENZ field distributions, propagating and localized SPhP, and coupling to zone-folded longitudinal phonons (ZFLO).…”
Section: Introductionmentioning
confidence: 99%
“…Epsilon-near-zero (ENZ) media, i.e., materials and/or metamaterial constructs with a near-zero permittivity, have become a very active field of research field due to their qualitatively different optical behavior. − A variety of wave phenomena emerge from the different physics of ENZ media, for example, supercoupling , and ideal fluid flow, , geometry-invariant resonators, directive emission, , photonic doping, nonradiating modes, − and guided modes with a flat dispersion profile, − just to name a few. Moreover, ENZ media intrinsically enhances light–matter interactions, as is the case for nonlinear optics, − electrical , and optical , modulation, spontaneous emission, − magnon-optical photon coupling, , entanglement generation, , and light concentration on ultrathin metallic films for thermal emitters , and optoelectronic devices. Additionally, ENZ systems are currently being used in prototypes of compact antennas and microwave network components, as well as for analog optical computing …”
Epsilon-near-zero (ENZ) media have been very actively
investigated
due to their unconventional wave phenomena and strengthened nonlinear
response. However, the technological impact of ENZ media will be determined
by the quality of realistic ENZ materials, including material loss
and surface roughness. Here, we provide a comprehensive experimental
study of the impact of surface roughness on ENZ substrates. Using
silicon carbide (SiC) substrates with artificially induced roughness,
we analyze samples whose roughness ranges from a few to hundreds of
nanometer size scales. It is concluded that ENZ substrates with roughness
in the few nanometer scale are negatively affected by coupling to
longitudinal phonons and strong ENZ fields normal to the surface.
On the other hand, when the roughness is in the hundreds of nanometers
scale, the ENZ band is found to be more robust than dielectric and
surface phonon polariton (SPhP) bands.
The emission of thermal radiation is a physical process of fundamental and technological interest. From different approaches, thermal radiation can be regarded as one of the basic mechanisms of heat transfer, as a fundamental quantum phenomenon of photon production, or as the propagation of electromagnetic waves. However, unlike light emanating from conventional photonic sources, such as lasers or antennas, thermal radiation is characterized for being broadband, omnidirectional, and unpolarized. Due to these features, ultimately tied to its inherently incoherent nature, taming thermal radiation constitutes a challenging issue. Latest advances in the field of nanophotonics have led to a whole set of artificial platforms, ranging from spatially structured materials and, much more recently, to time-modulated media, offering promising avenues for enhancing the control and manipulation of electromagnetic waves, from far-to near-field regimes. Given the ongoing parallelism between the fields of nanophotonics and thermal emission, these recent developments have been harnessed to deal with radiative thermal processes, thereby forming the current basis of thermal emission engineering. In this review, we survey some of the main breakthroughs carried out in this burgeoning research field, from fundamental aspects to theoretical limits, the emergence of effects and phenomena, practical applications, challenges, and future prospects.
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