Spectrally selective surfaces of Co-pigmented anodic Al2O3

Blain, Jason D.; Lebel, C.; Saint-Jacques, R.G.; Rheault, F.

doi:10.1063/1.335651

Cited by 16 publications

(6 citation statements)

References 12 publications

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“…Cracks in the oxide, made by bending the sample, revealed the cross-sectional structure. In common with previously published micrographs [17], [14], the micrographs showed channels of a fibrous nature in the oxide perpendicular to the surface.…”

Section: Sample Preparation and Sample Characterizationsupporting

confidence: 89%

The experimental dielectric function of porous anodic alumina in the infrared region; a comparison with the Maxwell-Garnett model

Wäckelgård¹

1996

J. Phys.: Condens. Matter

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The infrared reflectance from thin alumina films on metal substrates has a deep minimum for p-polarized light at oblique incidence. This originates from absorption when light couples with a longitudinal optical (LO) phonon mode with k-vector zero. The absorption band is wide for amorphous alumina and is shifted to longer wavelengths for porous oxides compared to non-porous ones. Anodic alumina, prepared in phosphoric acid, with a pore volume fraction of 0.3, has been investigated. The s-and p-polarized reflectance has been measured for selected angles of incidence between 15 • and 75 • , and the dielectric function has been determined from these measurements. The effective dielectric function has been calculated using Maxwell-Garnett effective-medium theory for a two-component anisotropic medium consisting of air-filled cylindrical pores perpendicular to the surface in an alumina matrix with optical constants of nonporous evaporated alumina. The theoretical and experimental results are in good agreement, which shows that the redshift of the LO mode absorption for p-polarized light can be explained by the presence of pores.

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Section: Sample Preparation and Sample Characterizationsupporting

confidence: 89%

The experimental dielectric function of porous anodic alumina in the infrared region; a comparison with the Maxwell-Garnett model

Wäckelgård¹

1996

J. Phys.: Condens. Matter

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“…Alumina (Al 2 O 3 ) is one of common matrix for small metallic particles in solar absorbers due to its stability at high temperature and transparency in long wavelength region. With the appropriate concentration of metallic particles and correct film thickness, this cermet layer has good solar selective properties (Blain et al 1985;Uchino et al 1979;Niklasson and Granqvist 1984;Wackelgard et al 1990). Nickel-pigmented alumina is a classic example for selective system (Salmi et al 2000).…”

Section: Introductionmentioning

confidence: 99%

The film thickness dependent thermal stability of Al2O3:Ag thin films as high-temperature solar selective absorbers

Xiao

Xiong

et al. 2012

J Nanopart Res

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The monolayer Al 2 O 3 :Ag thin films were prepared by magnetron sputtering. The microstructure and optical properties of thin film after annealing at 700°C in air were characterized by transmission electron microscopy, X-ray diffraction, X-ray photoelectron spectroscopy, and spectrophotometer. It revealed that the particle shape, size, and distribution across the film were greatly changed before and after annealing. The surface plasmon resonance absorption and thermal stability of the film were found to be strongly dependent on the film thickness, which was believed to be associated with the evolution process of particle diffusion, agglomeration, and evaporation during annealing at high temperature. When the film thickness was smaller than 90 nm, the film SPR absorption can be attenuated until extinct with increasing annealing time due to the evaporation of Ag particles. While the film thickness was larger than 120 nm, the absorption can keep constant even after annealing for 64 h due to the agglomeration of Ag particles. On the base of film thickness results, the multilayer Al 2 O 3 :Ag solar selective thin films were prepared and the thermal stability test illustrated that the solar selectivity of multilayer films with absorbing layer thickness larger than 120 nm did not degrade after annealing at 500°C for 70 h in air. It can be concluded that film thickness is an important factor to control the thermal stability of Al 2 O 3 :Ag thin films as high-temperature solar selective absorbers.

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“…that were required in magneto-optical devices, spectral filters, solar absorbers, photonic crystals, and membranes. [4][5][6][7][8][9][10][11] One possible application of metal nanowires is IR polarizers. 12) Recent progress in focal plane arrays has promoted needs for durable, low-cost IR polarizers.…”

Section: Introductionmentioning

confidence: 99%

Nickel Plating on Silicon for Fabricating an Infrared Wire-Grid Polarizer

Saito

Yamamoto

Yamada

et al. 2010

Jpn. J. Appl. Phys.

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An IR polarizer was fabricated by plating a Ni wire-grid on a Si substrate. The Si surface was processed by photolithography to create grooves with ∼200 nm width, ∼200 nm spacing, and ∼300 nm depth. After surface treatment, the Si plate was put in a plating bath for ∼5 min to fill the grooves with Ni. The excess Ni film that was deposited outside the grooves was removed by mechanical polishing. The fabricated wire-grid exhibited a polarization function with an extinction ratio of 15–20 dB in the 3–13 µm wavelength range.

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Spectrally selective surfaces of Co-pigmented anodic Al2O3

Cited by 16 publications

References 12 publications

The experimental dielectric function of porous anodic alumina in the infrared region; a comparison with the Maxwell-Garnett model

The experimental dielectric function of porous anodic alumina in the infrared region; a comparison with the Maxwell-Garnett model

The film thickness dependent thermal stability of Al2O3:Ag thin films as high-temperature solar selective absorbers

Nickel Plating on Silicon for Fabricating an Infrared Wire-Grid Polarizer

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