Abstract:As opposed to transmission imaging, X-ray Phase Contrast Imaging (XPCI) produces images with higher contrast and allows us to distinguish between materials that are weakly attenuating or between materials that possess similar attenuation values. Edge Illumination (EI), a type of XPCI, utilizes spatial variation to uncover information about an object's phase properties, such as the index of refraction. Instead of spatial variation, we previously proposed an alternative EI method, Spectrally Responsive Edge Illu… Show more
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