Abstract:Conventional interferometry is widely used to measure spherical and flat surfaces with nanometer level precision but is plagued by back reflections. We describe a new method of isolating the measurement surface by controlling spectral properties of the source (Spectrally Controlled Interferometry-SCI). Using spectral modulation of the interferometer's source enables formation of localized fringes where the optical path difference is non-zero. As a consequence it becomes possible to form white-light like fringe… Show more
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