Spectral Properties of Semiconductor Photodiodes

Saito, T.

doi:10.5772/15300

Cited by 12 publications

(11 citation statements)

References 21 publications

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“…The photo diodes used were calibrated in underfilled mode and we used them in underfilled mode as well. Due to spatial response variation of the photo diode, one can expect an increasing uncertainty in the infrared range (somewhere above 900 nm) with increasing wavelength as well as an uncertainty increase in the UV range [17]. The exact wavelength cannot be determined from the referenced paper since the spectral resolution is too low.…”

Section: Spectral Quantum Efficiency Resultsmentioning

confidence: 99%

Quantum efficiency measurements of (EM)CCD cameras: high spectral resolution and temperature dependence

Sperlich¹,

Stolz²

2013

Meas. Sci. Technol.

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Nowadays, CCD cameras can be found in every optical laboratory for highly diverse purposes. Measuring quantitatively spectral-dependent intensities implies that the spectral quantum efficiency (SQE) has to be taken into account, at least if the width of the spectrum is more than a few nm. The determination of the SQE is usually considered to be a tedious challenge with rather inaccurate results. However, we show in this paper that with calibrated photo diodes, this has become an affordable and straightforward task. In this paper, we examined the SQE of one front- and five back-illuminated electron multiplying CCD cameras from Andor Technology in the range of 350–1080 nm with a spectral resolution of up to 1 nm. The temperature dependence of the SQE has been investigated in the spectral interval given above between +20 and −80 °C. We observed unexpected oscillations in the SQE for the front-illuminated camera. For back-illuminated cameras with an ultraviolet conversion layer, the measured SQE turns out to be very different from the manufacturer data, which results from the transmittance spectrum of the conversion layer. For conventional back-illuminated cameras without a conversion layer, we observed interesting crossing behavior in the temperature-dependent measurements.

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Section: Spectral Quantum Efficiency Resultsmentioning

confidence: 99%

Quantum efficiency measurements of (EM)CCD cameras: high spectral resolution and temperature dependence

Sperlich¹,

Stolz²

2013

Meas. Sci. Technol.

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“…The relationship between η vis (λ) and the spectral responsivity S (λ) (A/W) of photodetectors can be expressed as [10].…”

Section: Ultra-low-range Illuminance Scalementioning

confidence: 99%

Extension of NIM illuminance scale to very low levels (1 × 10⁻¹⁰ lx to 2 lx)

Lv¹,

Jiang²,

Lin³

et al. 2022

Metrologia

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The realization of the low light level illuminance scale of the National Institute of Metrology (NIM, China) is presented. Two methods were used to achieve the photometric scale covering (1×10-10～2×100) lx, the first method based on the luminance adjustable two-stage integrating sphere source was used to realize the illuminance scale down to 1×10-6 lx, while the other method based on a twin-source superposition linearity measurement facility was applied to extend the scale from 1×10-6 lx to 1×10-10 lx. The expanded relative uncertainty of the (1×10-10～2×100) lx illuminance scale was evaluated to be from 1.0% to 0.8% varying with range (coverage factor k=2). As part of our research work, a photon counting type photometer was developed and calibrated in the (2×10-10～1×10-6) lx range using this low light level illuminance scale with expanded relative uncertainty 13% to 1.4% (k=2). This low light level photometric scale can meet the calibration requirement of high sensitivity photometers such as the micro-lux photometers and photon counting type photometers.

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“…For instance, when two radiation sources are compared directly by using a common monochromator with a detector, the detected signal ratios depend on the difference in polarization status between the two sources since monochromator system is polarization sensitive. Besides monochromator, reflection-based mirror optical systems or oblique incident detectors [3,4] are, in general, also polarization sensitive since reflectance between the s-component and p-component (the incident electric vector is, respectively, normal, and parallel to the plane of incidence) are different. Quantitative estimate is as follows.…”

Section: Introductionmentioning

confidence: 99%

Polarization Characterization of LEDs by Stokes Parameters Measurements

Saito

Sutani

Kiyono

et al. 2022

J. Phys.: Conf. Ser.

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Stokes parameters have been measured by using a polarimeter consisting of a rotating phase plate before a fixed polarizer for bullet-shaped red, green and blue LEDs at 3 different directions of 0°, 45° and 90° from the principal axis. The degree of polarization is minimum at the observation angle 0° (observed head-on) for all colors as expected but has non-zero values (1-9%). As for the possible cause for the partial polarization, it is likely to be brought by striae inside the transparent epoxy resin that can be easily visible. Data at observation angle 90° have features common for all colors; the degree of polarization is highest, the long axis azimuth of the polarization ellipse is nearly in the horizontal direction, and the ellipticity is small. These features can be explained as follows. At observation angle 90°, only small fraction of the beam emitted nearly horizontally is detected possibly through multireflection (the plane of incidence is in the vertical plane) inside the top- and bottom-surfaces (in the horizontal direction) of the chip substrate. Since the reflectance for s-polarization (horizontal component) is higher than that for p-polarization, the emerging beam becomes horizontally polarized. The hypotheses that geometrical asymmetry generates polarization is experimentally supported.

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Spectral Properties of Semiconductor Photodiodes

Cited by 12 publications

References 21 publications

Quantum efficiency measurements of (EM)CCD cameras: high spectral resolution and temperature dependence

Quantum efficiency measurements of (EM)CCD cameras: high spectral resolution and temperature dependence

Extension of NIM illuminance scale to very low levels (1 × 10⁻¹⁰ lx to 2 lx)

Polarization Characterization of LEDs by Stokes Parameters Measurements

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Spectral Properties of Semiconductor Photodiodes

Cited by 12 publications

References 21 publications

Quantum efficiency measurements of (EM)CCD cameras: high spectral resolution and temperature dependence

Quantum efficiency measurements of (EM)CCD cameras: high spectral resolution and temperature dependence

Extension of NIM illuminance scale to very low levels (1 × 10−10 lx to 2 lx)

Polarization Characterization of LEDs by Stokes Parameters Measurements

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Extension of NIM illuminance scale to very low levels (1 × 10⁻¹⁰ lx to 2 lx)