Spectral information content of Compton scattering events in silicon photon counting detectors
Scott S. Hsieh,
Katsuyuki Taguchi
Abstract:BackgroundSilicon (Si) is a possible sensor material for photon counting detectors (PCDs). A major drawback of Si is that roughly two‐thirds of x‐ray interactions in the diagnostic energy range are Compton scattering. Because Compton scattering is an energy‐insensitive process, it is commonly assumed that Compton events retain little spectral information.PurposeTo quantify how much information can be recovered from Compton scattering events in models of Si PCDs.MethodsWe built a simplified model of Si interact… Show more
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