The work is devoted to the development, fabrication and analysis of broadband W / Si multilayer mirrors for a broadband monochromator, calculated for the spectral range of 7-10 keV. The possibility of using the stacking approach to obtain multilayer mirrors with a reflection coefficient of about 30% and a spectral bandwidth Delta E/E of about 20% is shown. The results of measurements of the angular and spectral reflection curves of the mirror obtained on a laboratory diffractometer and on a synchrotron in Novosibirsk are presented. Keywords: hard X-ray range, monochromator, synchrotron radiation, broadband mirrors, stack structures, multilayer X-ray mirrors.