1998
DOI: 10.1524/teme.1998.65.3.96
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Speckle-Interferometrie mit Diodenlasern zur Formprüfung

Abstract: Diode laser based speckle interferometry for dimensional measurementsIn Electronic Speckle-Pattern Interferometry (ESPI) the utilization of tuneable diode lasers enables us to measure the 3D topography of technical freeform surfaces. The resolution of this so-called Two Wavelength ESPI (TWESPI) depends decisively on the tuneable wavelength range of the used laser source. With a Distributed-Bragg-Reflector Laser (DBR-Laser) shape measurements were carried out successfully. In this paper new methods for the exte… Show more

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“…The physical quantity measured using interferometric techniques is the intensity distribution I of the interference pattern, given by (6) I = Jo (1 + ycos (0 + 'Pstat)) (6) '0 specifies the intensity of the interferogram and y the contrast of modulation of the interference signal. The contour phase is directly proportional to the optical path difference between the measurement-and the reference-arm of the experimental set-up.…”
Section: Espi Contouringmentioning
confidence: 99%
“…The physical quantity measured using interferometric techniques is the intensity distribution I of the interference pattern, given by (6) I = Jo (1 + ycos (0 + 'Pstat)) (6) '0 specifies the intensity of the interferogram and y the contrast of modulation of the interference signal. The contour phase is directly proportional to the optical path difference between the measurement-and the reference-arm of the experimental set-up.…”
Section: Espi Contouringmentioning
confidence: 99%