Specimen homogeneity requirements for EDS in high count rate mode

Eggert, Frank; Schleifer, M; Reinauer, Felix

doi:10.1088/1757-899x/55/1/012004

IOP Conf. Ser.: Mater. Sci. Eng.

2014

DOI: 10.1088/1757-899x/55/1/012004

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Specimen homogeneity requirements for EDS in high count rate mode

Frank Eggert¹,

M Schleifer²,

Felix Reinauer³

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Specimen homogeneity requirements for EDS in high count rate mode

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References 3 publications

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