The current flow at a fixed gate voltage and the floating gate voltage for fixed charge density in a gated GaAs heterostructure have been measured as a function of the magnetic field. The voltage oscillations which reflect the behaviour of the chemical potential have been clearly resolved. The experimental results are explained by a statistical model of inhomogeneities in the carrier concentration implying an effective density of states between the Landau levels.Recently, measurements have been performed on GaAs-heterostructures in order to obtain information about the density of states (DOS) of a twodimensional electron gas (2DEG) in a strong quantizing magnetic field. The activation energy of P~z [1][2][3], the capacitance [4][5][6], the specific heat [7] and the magnetization [8] have been investigated. Some of these measurements are sensitive only in certain energy regions of the DOS. The capacitance measurement fails [4,5] for example in the interesting region between the Landau levels due to the vanishing conductivity of the 2DEG in that region. This problem of high series resistance can be reduced by using a backside contact (n +) instead of the channel contacts [6]. In the present paper we will discuss another type of measurement which is closely related to the capacitance measurement but more sensitive to the actual form of the DOS in the whole magnetic field region, even though channel contacts are used. In this measurement the current between the top gate and the 2DEG is measured as a function of the magnetic field B. This current, the " gate current", is directly related to the changes in the DOS and the capacitance as a function of B [2,9]. We also report a measurement of the gate voltage Vg, i.e. the voltage between the gate and the 2DEG, as a function of B. In comparision to earlier experiments [t0] we see clear oscillations which follow quantitatively the variation of the chemical potential # of the 2DEG. The results from the gate current measurement [2] can only be explained poorly by the adhoc simple background model assuming a constant background. On the other hand a recently proposed model [9,11] on statistical inhomogeneities of the carrier density no is shown to reproduce the experimental results excellently, both in the case of the gate current and the gate voltage. After a description of the experimental set up the inhomogeneity model will briefly be introduced. Then the experimental results will be discussed and compared with calculations based on the inhomogeneity model.The experiments described here have been carried out on an A1GaAs-GaAs heterostructure with a low temperature mobility/~ = 585, O00cm2/V8 and a carrier density n, = 1.90 • 1011cm-2. The sample has the usual mesa Hall geometry (see Fig. 1) with an Au-gate on top (area 5.65mm2). All potential probes were short circuited and acted as a channel contact. The top layers (GaAs/Si-doped A1GaAs and undoped A1GaAs spacer) are completely depleted and therefore insulating. Both, current (gate voltage V 9 = const) and voltage (carrie...