Special issue: 26th international symposium on VLSI design and test 2022

Abstract

This special issue comprises 7 articles selected after a rigorous review process of the extended versions of papers presented at VDAT-2022. Accepted articles covers various aspects of microelectronics devices, ADC, in-memory computation, reliability and security in integrated circuits, various architectures and devices, and focusing at different levels of abstraction from device level to system level. i. Paper "Design of a tunable delay line with on-chip calibration to generate process-invariant PWM signal for inmemory computing" by Kavita Monga et al. [1] address the two major issues with the in-memory computation. For precise operation, the applied input signals must be stable and during the input signal generation is the deviation in the width values due to process, voltage, and temperature variations. Authors have proposed to design a tunable delay line that provides a linear PWM signal corresponding to an input vector which is further utilized to perform local computation in memory. ii. Paper "Cadmium sulfide deposition suited for photo pattern-based SAW device" by Rahul Sharma et al. [2] demonstrates a surface acoustic wave (SAW) device based on photopatterned interdigital transducer (IDT) created on a cadmium sulfide layer deposited over a lithium niobate substrate using two methods, viz. chemical bath deposition (CBD) and spin-coating. I-V characteristics are measured for photo pattern-based SAW devices with different electrode separation widths. iii. Paper "Design of a high precision CMOS programmable gain and data rate delta sigma ADC" by Mohd Asim Saeed et al. [3] presents a general purpose high precision Delta Sigma (ΔΣ) ADC with a common mode rejection of 100 dB, developed for data acquisition of sensors used in a satellite launch vehicle telemetry system. The ADC is also equipped with on chip offset and