2014
DOI: 10.1088/0957-4484/25/46/465702
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Spatially resolved In and As distributions in InGaAs/GaP and InGaAs/GaAs quantum dot systems

Abstract: InGaAs quantum dots (QDs) on GaP are promising for monolithic integration of optoelectronics with Si technology. To understand and improve the optical properties of InGaAs/GaP QD systems, detailed measurements of the QD atomic structure as well as the spatial distributions of each element at high resolution are crucial. This is because the QD band structure, band alignment, and optical properties are determined by the atomic structure and elemental composition. Here, we directly measure the inhomogeneous distr… Show more

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Cited by 3 publications
(3 citation statements)
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References 37 publications
(67 reference statements)
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“…Outside the QD area, the concentrations of As and Sb decrease rapidly, while the P level reaches the level of the initial GaP substrate. Since only small As-P intermixing between GaP and the QDs is expected [63], we assume that all phosphorus is bound in GaP, and therefore the concentration of Ga can be divided into Ga concentration in GaP C GaP and in the QD area C QD Ga as…”
Section: Sample Fabrication and Structural Characterizationmentioning
confidence: 99%
“…Outside the QD area, the concentrations of As and Sb decrease rapidly, while the P level reaches the level of the initial GaP substrate. Since only small As-P intermixing between GaP and the QDs is expected [63], we assume that all phosphorus is bound in GaP, and therefore the concentration of Ga can be divided into Ga concentration in GaP C GaP and in the QD area C QD Ga as…”
Section: Sample Fabrication and Structural Characterizationmentioning
confidence: 99%
“…(In,Ga)As/GaP QDs lasing was even recently reported on GaP substrate by Heidemann et al [25]. Meanwhile, structural properties of these QDs were investigated at a large scale in terms of size and density [20,[26][27][28] and at the atomic scale through transmission electron microscopy (TEM), planview, and cross-sectional scanning tunneling microscopy (STM) [29][30][31][32], revealing a complex and inhomogeneous indium incorporation behavior inside the QDs. Fukami et al first noticed in their pioneering works the vicinity of the conduction band minimum in the QD and the X valley of GaP with a simple model-solid theory approach [33].…”
Section: Introductionmentioning
confidence: 91%
“…However, compared with growth on III-V substrates, relatively little is known about the atomic structure and stoichiometry of III-V nanostructures for laser devices grown on silicon substrates. 13,14 Cross-sectional scanning tunneling microscopy (XSTM) is a powerful method to investigate the structural details of III-V nanostructures, e.g., size, shape, and stoichiometry, grown on different III-V substrates. [15][16][17] A clean crosssectional III/V{110} surface for XSTM investigations can easily be prepared by cleaving the III-V(001) substrate in an ultrahigh-vacuum (UHV) chamber.…”
mentioning
confidence: 99%