“…In this context, probing PL intermittency (“blinking”) of OHP nanocrystals (NCs), − microcrystalline rods, , and films ,− becomes relevant to study the nature of defect states under different environments . While PL intermittency for OHP NCs has been related to surface defects involved in carrier recombination pathways, ,− similar to that for conventional inorganic NCs, blinking/flickering of microcrystalline disks/thin-films ,, is attributed to transient mobile defects which act as strong quenchers. , More importantly, different blinking characteristic as well as gradual change in PL intensity over slower time scales (second to minute) has been ascribed to generation or passivation of various (deep/shallow) trap states during degradation or curing of the material in the presence of light ,− and atmospheric conditions. ,,,, Thereby, nature of the defects involved in the emission cycle have often been related to the emissivity of the crystals. ,,,− However, PL intermittency and emissivity of OHP NCs from different systems are found to be contrasting under the similar atmospheric conditions suggesting the different nature of active defects. , Moreover, like inorganic quantum dots, OHP NCs of similar composition and morphology can also exhibit heterogeneous blinking characteristics in the ensemble under identical measurement conditions which likely owes to diverse origin and distribution of defects in the crystals. , Therefore, it is necessary to investigate the same NC as well as the large population of individual OHP crystals under sequential environments in order to reliably correlate their PL characteristics, which has rarely been attempted …”