Spatial pattern of a class of SI models driven by cross diffusion
Yuan-Shan Lu,
Min Xiao,
You-Hong Wan
et al.
Abstract:Currently, most research on the spatial patterns of the SI model, both domestically and internationally, focuses on the impacts of self-diffusion and system parameters on pattern formation. However, there is a little study on how cross-diffusion influences the evolution of spatial patterns. In this paper, a spatial epidemic model with both self-diffusion and cross-diffusion is established. The study investigates the effects of cross-diffusion on the stability, rate of stability, and pattern structure of the SI… Show more
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