1994
DOI: 10.1063/1.111097
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Spatial hole burning and self-focusing in vertical-cavity surface-emitting laser diodes

Abstract: Articles you may be interested inPhysics of mode selectivity of vertical-cavity surface-emitting diode lasers

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Cited by 67 publications
(14 citation statements)
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“…[3][4][5][6] It is indeed the major effect that induces transitions to higher order modes. Spatial hole burning is referring to the local depletion of the carrier density at points within the laser where the modal intensity is large.…”
Section: Introductionmentioning
confidence: 98%
“…[3][4][5][6] It is indeed the major effect that induces transitions to higher order modes. Spatial hole burning is referring to the local depletion of the carrier density at points within the laser where the modal intensity is large.…”
Section: Introductionmentioning
confidence: 98%
“…The well-known spatial hole burning (SHB) effect which is produced by the local interaction between the optical field and carrier distributions in the laser active layer is regard as the primary cause of high-order transverse mode emitting [5][6][7][8] . In order to describe SHB and other effects related to the inhomogeneous lateral distribution of carriers and photons in the cavity, the space-and time-dependent rate equations, which describe the rates of change of the carrier and photon populations in the active layer, are adopted to provide excellent foundation for our VCSEL model in this paper.…”
Section: Introductionmentioning
confidence: 99%
“…A single transverse mode operation can be achieved via the introduction of mode-selective losses or by reducing the size of the cavity in both transverse and longitudinal directions [5,6]. The primary cause of the transverse mode competition is attributed to the well-known spatial hole burning effects (SHB-effects), which are produced by the interaction between the carriers and the multi-transverse modes in the laser active layer [7][8][9][10][11][12]. It signifies that the injection current plays a very important role in the multitransverse mode behavior of VCSELs.…”
mentioning
confidence: 99%