2021
DOI: 10.1021/acsnano.1c01242
|View full text |Cite
|
Sign up to set email alerts
|

Spatial Control of Dynamic p–i–n Junctions in Transition Metal Dichalcogenide Light-Emitting Devices

Abstract: Emerging transition metal dichalcogenides (TMDCs) offer an attractive platform for investigating functional light-emitting devices, such as flexible devices, quantum and chiral devices, high-performance optical modulators, and ultralow threshold lasers. In these devices, the key operation is to control the light-emitting position, that is, the spatial position of the recombination zone to generate electroluminescence, which permits precise light guides/passes/confinement to ensure favorable device performance.… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
13
0

Year Published

2022
2022
2024
2024

Publication Types

Select...
6

Relationship

1
5

Authors

Journals

citations
Cited by 10 publications
(13 citation statements)
references
References 44 publications
(101 reference statements)
0
13
0
Order By: Relevance
“…In this device, the light‐emitting positions can be continuously tuned by the bias conditions, based on the principle that we established in our previous report. [ 39 ] Thus, when we laterally control the light‐emitting position inside the channels, their EL energy would vary according to the gradient in the composition‐dependent bandgap (Figure 3b). We removed the residual flakes from outside the channel regions by plasma etching to define precisely the electrical current path parallel to the channel length, as shown in the optical microscopy image in Figure 3b (sample #3).…”
Section: Resultsmentioning
confidence: 99%
See 3 more Smart Citations
“…In this device, the light‐emitting positions can be continuously tuned by the bias conditions, based on the principle that we established in our previous report. [ 39 ] Thus, when we laterally control the light‐emitting position inside the channels, their EL energy would vary according to the gradient in the composition‐dependent bandgap (Figure 3b). We removed the residual flakes from outside the channel regions by plasma etching to define precisely the electrical current path parallel to the channel length, as shown in the optical microscopy image in Figure 3b (sample #3).…”
Section: Resultsmentioning
confidence: 99%
“…To observe the EL, electrical measurements were performed using a semiconductor parameter analyzer (Agilent Technologies, Inc. E5270) with a custom‐made spectroscopy setup inside an N 2 ‐filled glove box. [ 39 ] The device was set on a microscope equipped with a CCD camera (SHODENSHA) and a spectrometer (Hamamatsu Photonics K.K. ); a half mirror was placed above the device to guide the emitted light in two separate directions.…”
Section: Methodsmentioning
confidence: 99%
See 2 more Smart Citations
“…In such structures, electrons and holes are injected simultaneously into a TMDC from two electrode terminals when a bias voltage is applied. 23–29…”
Section: Introductionmentioning
confidence: 99%