2004
DOI: 10.1002/polb.20268
|View full text |Cite
|
Sign up to set email alerts
|

Space charge studies of crosslinked polyethylene midvoltage cable insulation by thermally stimulated depolarization current, infrared/Fourier transform infrared, and scanning electron microscopy

Abstract: We studied the space charge behavior in crosslinked polyethylene cable insulation with thermally stimulated depolarization current (TSDC). The role of the semiconducting layers of the cable in space charge formation was determined with several experiments carried out with two different cables. TSDC spectra were obtained through the exchange of the semiconducting layers of each cable with aluminum or silver coatings. Heteropolar current peaks at 80 and 105 °C were observed in the TSDC spectrum. As a sample was … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

2
17
0
1

Year Published

2006
2006
2020
2020

Publication Types

Select...
7

Relationship

2
5

Authors

Journals

citations
Cited by 18 publications
(20 citation statements)
references
References 10 publications
2
17
0
1
Order By: Relevance
“…In those measurements, annealing up to 400 h at 90 ºC with the SC shields resulted in increments in σ up to five times the value obtained when annealed without the SC shield. These results suggest that the presence and diffusion of croslinking by-products is not the main reason of the observed maximum in σ, however, long term diffusion of acrylate species and other components from the SC shields into the XLPE [15,24] can explain this behavior. { TC "5 Weight loss in XLPE insulation versus annealing time at 90 EQ \s\up5(o)" \l 1 } Assuming that conductivity in XLPE is associated with a hopping mechanism, as the Mott plot suggests (figures 3 and 4), we can adequately explain the observed change in σ after long annealing times as follows; In the hopping mechanism, the energy difference and the distance between traps should modulate the whole process.…”
Section: Conduction Mechanismmentioning
confidence: 89%
See 3 more Smart Citations
“…In those measurements, annealing up to 400 h at 90 ºC with the SC shields resulted in increments in σ up to five times the value obtained when annealed without the SC shield. These results suggest that the presence and diffusion of croslinking by-products is not the main reason of the observed maximum in σ, however, long term diffusion of acrylate species and other components from the SC shields into the XLPE [15,24] can explain this behavior. { TC "5 Weight loss in XLPE insulation versus annealing time at 90 EQ \s\up5(o)" \l 1 } Assuming that conductivity in XLPE is associated with a hopping mechanism, as the Mott plot suggests (figures 3 and 4), we can adequately explain the observed change in σ after long annealing times as follows; In the hopping mechanism, the energy difference and the distance between traps should modulate the whole process.…”
Section: Conduction Mechanismmentioning
confidence: 89%
“…{ TC "5 Weight loss in XLPE insulation versus annealing time at 90 EQ \s\up5(o)" \l 1 } Assuming that conductivity in XLPE is associated with a hopping mechanism, as the Mott plot suggests (figures 3 and 4), we can adequately explain the observed change in σ after long annealing times as follows; In the hopping mechanism, the energy difference and the distance between traps should modulate the whole process. If we take into account a possible diffusion of components from the SC shields into the XLPE bulk (as previous works suggest [24], annealing should promote an increase in conductivity because of the increase in traps density. This phenomena can explain the increase in σ observed for annealing times up to 30-40 days.…”
Section: Conduction Mechanismmentioning
confidence: 94%
See 2 more Smart Citations
“…These mechanisms should take into account the processes of space charge accumulation, charge transport and the distributions and concentrations of trapping centers [39]. Recent investigations ("ARTEMIS" European project [14,40]) have already characterized PE insulation by using "ageing markers".…”
Section: Further Conduction Modellingmentioning
confidence: 99%