1989
DOI: 10.1088/0953-8984/1/39/013
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Space-charge anomalies in insulators caused by non-local impact ionisation

Abstract: The non-local nature of impact ionisation is modelled using lucky-drift theory with the assumption that the relevant electric field is the average field, but that the relevant drift velocity is that associated with the local field. The carrier density relevant for impact ionisation is also taken to be non-local. The model is applied to the case of a thin film insulator, with Fowler-Nordheim injections of electrons at the cathode. For clarity's sake, the authors avoid considering the excitation of holes and lim… Show more

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Cited by 13 publications
(6 citation statements)
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“…'Large' means that the difference with E F , namely φ 0 + eU, is much larger than kT, which is the usual range, above E F , where conduction-band states of the metal are significantly populated in thermal equilibrium according to the Fermi-Dirac statistics (3). Upon entering the anodic plate, the hot electron releases its excess energy φ 0 + eU in scattering events with the lattice until its energy approaches E F ; the rate of energy loss is called the stopping power [15,16] and the relevant length of relaxation of energy is much longer than the mean free path associated with momentum relaxation [17,18]. This comes about because only a small fraction of the energy is relaxed in one scattering event.…”
Section: The Dissipation Of Electric Powermentioning
confidence: 99%
“…'Large' means that the difference with E F , namely φ 0 + eU, is much larger than kT, which is the usual range, above E F , where conduction-band states of the metal are significantly populated in thermal equilibrium according to the Fermi-Dirac statistics (3). Upon entering the anodic plate, the hot electron releases its excess energy φ 0 + eU in scattering events with the lattice until its energy approaches E F ; the rate of energy loss is called the stopping power [15,16] and the relevant length of relaxation of energy is much longer than the mean free path associated with momentum relaxation [17,18]. This comes about because only a small fraction of the energy is relaxed in one scattering event.…”
Section: The Dissipation Of Electric Powermentioning
confidence: 99%
“…Non-local effect and dark space are incorporated in a straight forward manner ( Ridley and El-Ela, [9] ). The barrier height at the cathode is assumed to be 1.0 e.V and the deep-level trap is 3 e.V below the C.B while the shallow .…”
Section: Model System and The Soft Lucky-drift Formulamentioning
confidence: 99%
“…It must be emphasized, however, that the present work focuses only on the trapping process as a possible source of instabilities in semiinsulating semiconductors, but does not preclude the role of other mechanisms. For example, nonlocal impact ionization, 22 two-stream instabilities and optical phonon emission, 23 and detrapping within high-field domains 7 have also been shown to be potential sources for current oscillations and instabilities.…”
Section: Introductionmentioning
confidence: 99%