2013 IEEE International Topical Meeting on Microwave Photonics (MWP) 2013
DOI: 10.1109/mwp.2013.6724076
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Sources of nonlinearity in a PIN photodetector at high applied reverse bias

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Cited by 4 publications
(6 citation statements)
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“…To model the carrier transport in the photodetector, we use both 1D and 2D drift-diffusion models [4], [5], [12], [15]- [21]. This model consists of three equations that govern the dynamics of the electron density n, the hole density p, and the electric field E (gradient of the electrostatic potential, ϕ),…”
Section: B Basic Drift-diffusion Modelmentioning
confidence: 99%
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“…To model the carrier transport in the photodetector, we use both 1D and 2D drift-diffusion models [4], [5], [12], [15]- [21]. This model consists of three equations that govern the dynamics of the electron density n, the hole density p, and the electric field E (gradient of the electrostatic potential, ϕ),…”
Section: B Basic Drift-diffusion Modelmentioning
confidence: 99%
“…Subsequent to the early simulation work [2]- [5], it has been discovered that several effects not included in the original studies can play an important role. These include external loading [6], thermionic emission at the heterojunction boundaries [7]- [9], incomplete ionization [9], impact ionization [9]- [12], and the Franz-Keldysh effect [13].…”
mentioning
confidence: 99%
“…To study carrier transport in the photodetector, we model a PDA photodetector in two dimensions, longitudinal and radial, using the 2D drift-diffusion equations [2,4,[11][12][13] with the configuration of Figs. 1 and 2, coupled with the heat flow equation.…”
Section: Drift-diffusion Modelmentioning
confidence: 99%
“…Impact ionization is also an important source of nonlinearity in the photodetector [2,4]. It can lead to an important increase in the electron and hole densities.…”
Section: Impact Ionizationmentioning
confidence: 99%
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