Some recent progress on the measurement of K-shell ionization cross-sections of atoms by electron impact: Application to Ti and Cr elements

Measurements of Lα, Lβ X-ray production cross sections of Bi by 17–40keV electron impact

“…The details of RBS experiment were given in Ref. [23]. The mass thickness value of Bi target film measured by our RBS experiment was agree, within $6% accuracy, with the value given by the target manufacturer.…”

Experimental determination of cross sections forK-shell ionization by electron impact for C, O, Al, Si, and Ti

“…Even though this oxide layer is very thin (usually around a few nanometers) and has been disregarded in the older literature [11], it does influence the x-ray spectra measured at low voltages, as can be observed in the spectra of the carbon substrate and of the aluminum film measured at 3 keV (Fig. 1).…”

“…These include the film thickness and mass density, the intrinsic efficiency of the x-ray detector, the solid angle subtended by the detector, substrate effects, fluorescence yields, relative transition probabilities, and the mass concentration of the element of interest. The highest uncertainties are usually related to the determination of the film mass thickness [11]. The error in detector efficiency is also important [11], and affects mainly elements with low atomic number, whose characteristic energies are lower than 1 keV.…”

“…The highest uncertainties are usually related to the determination of the film mass thickness [11]. The error in detector efficiency is also important [11], and affects mainly elements with low atomic number, whose characteristic energies are lower than 1 keV. Significant errors in the solid angle can arise from small modifications in the detector-sample distance or in the detector effective area.…”

“…Thickness and density of the films were characterized by x-ray reflectivity (XRR). The results were compared with experimental data from other authors [11,[15][16][17][18][19][20][21][22] and with theoretical and semiempirical curves available in the literature [4,9,10,[23][24][25][26][27][28].…”