Some Issues of Dependencies of Loss from Technological Features of Optical Switches for Communication Systems

Filipenko, A. I.; Chala, Olena; Sychova, Oksana

doi:10.1109/infocommst.2018.8632051

Cited by 5 publications

(3 citation statements)

References 9 publications

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“…In [6] the fundamental solution is obtained and completely described in the dyadic representation. This representation follows naturally from the known fact that any tensor may be written as the sum of three dyads.…”

Section: General Integral Statement Of the Mhd Boundary-value Problemmentioning

confidence: 99%

Investigation of the Boundary-Valued Problem on Resonance MHD Non-Uniformity by Integral Equations Using

Oleksandrov¹,

Невлюдов²,

Chala³

et al. 2021

Problems of Atomic Science and Technology

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Section: General Integral Statement Of the Mhd Boundary-value Problemmentioning

confidence: 99%

Investigation of the Boundary-Valued Problem on Resonance MHD Non-Uniformity by Integral Equations Using

Oleksandrov¹,

Невлюдов²,

Chala³

et al. 2021

Problems of Atomic Science and Technology

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“…Since the functional component of the MOEMS switch is Micro Mirror, having considered its structure [20][21][22], we conclude that defects in such functional components at the production stage are based on defects of three groups: Taking this into account, it is possible to represent a mathematical model of a set of manufacturing defects of functional components of MOEMS in the form (1):…”

Section: Influence Of Constructive and Technological Factors Of The Pmentioning

confidence: 99%

“…where  D is a diffusion coefficient; , where the oxidation reaction takes place [22][23][24][25][26][27].…”

Section: Influence Of Constructive and Technological Factors Of The Pmentioning

confidence: 99%

Mathematical Model of the Development of Manufacturing Defects in the Surface Layer of Substrates of Moems’ Functional Components

Невлюдов

Omarov

Chala

2020

Eskişehir Technical University Journal of Science and Technology a - Applied Sciences and Engineering

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A mathematical model of the development of manufacturing defects, with the prediction of the random component of the model in the substrates of functional components of MOEMS, which are made of semiconductors, in particular, silicon, are developed in the article. The main manufacturing defects that arise in the surface layer of the substrates of the MOEMS functional components taking into account the technological processes of their production and dynamic processes were used when developing the model. The developed mathematical model takes into account the occurrence of a random component of the model with its predictive ability. The possibility of such control is the basis for the development of the scientific direction of technology and equipment for the production of semiconductors, materials and electronic devices-defect engineering, based on the management and forecasting of defect formation processes.

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Impact of Technological Operations Parameters on Moems Components Formation

Filipenko¹,

Chala²,

Bortnikova³

et al. 2019

2019 IEEE 8th International Conference on Advanced Optoelectronics and Lasers (CAOL)

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Some Issues of Dependencies of Loss from Technological Features of Optical Switches for Communication Systems

Cited by 5 publications

References 9 publications

Investigation of the Boundary-Valued Problem on Resonance MHD Non-Uniformity by Integral Equations Using

Investigation of the Boundary-Valued Problem on Resonance MHD Non-Uniformity by Integral Equations Using

Mathematical Model of the Development of Manufacturing Defects in the Surface Layer of Substrates of Moems’ Functional Components

Impact of Technological Operations Parameters on Moems Components Formation

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