Some Inferences about Gamma Parameters with an Application to a Reliability Problem

Lentner, M. M.; Buehler, Robert J.

doi:10.1080/01621459.1963.10500877

Cited by 29 publications

(1 citation statement)

References 6 publications

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“…uniformly most accurate unbiased, confidence limits (Lentner & Buehler, 1963). When test data consist of times to failure the numbers of failures are usually small compared to the sample sizes used for binomial testing and two adjustments are required to give effective improvements.…”

Section: Introductionmentioning

confidence: 99%

Asymptotic Expansions to Improve Large Sample Confidence Intervals for System Reliability

Winterbottom¹

1980

Biometrika

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JSTOR is a not-for-profit service that helps scholars, researchers, and students discover, use, and build upon a wide range of content in a trusted digital archive. We use information technology and tools to increase productivity and facilitate new forms of scholarship. For more information about JSTOR, please contact support@jstor.org.. Biometrika Trust is collaborating with JSTOR to digitize, preserve and extend access to Biometrika. SUMMARY Asymptotic expansions are used to provide first-and second-order adjustments to large sample approximations for system reliability confidence intervals obtained from component test data. The effectiveness of the adjustments for sample sizes of practical interest is demonstrated by numerical comparisons with results obtained using exact methods and also by a Monte Carlo study for systems with known reliabilities.

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Section: Introductionmentioning

confidence: 99%